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Rei KONISHI

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,971,426
    • Issue date Apr 30, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Rei Konishi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,965,902
    • Issue date Apr 23, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Kei Shioya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,808,671
    • Issue date Nov 7, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Sakuichiro Adachi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,579,159
    • Issue date Feb 14, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Rei Konishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,293,935
    • Issue date Apr 5, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Rei Konishi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analysis device and automatic analysis method
    • Patent number 11,231,432
    • Issue date Jan 25, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Hiroki Akase
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,067,590
    • Issue date Jul 20, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Rei Konishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,690,688
    • Issue date Jun 23, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Rei Konishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 10,466,261
    • Issue date Nov 5, 2019
    • Hitachi High-Technologies Corporation
    • Minoru Sano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 10,330,604
    • Issue date Jun 25, 2019
    • Hitachi High-Technologies Corporation
    • Rei Konishi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210148943
    • Publication date May 20, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210080478
    • Publication date Mar 18, 2021
    • Hitachi High-Technologies Corporation
    • Kei SHIOYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210025911
    • Publication date Jan 28, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Sakuichiro ADACHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20200278366
    • Publication date Sep 3, 2020
    • Hitachi High-Technologies Corporation
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200200784
    • Publication date Jun 25, 2020
    • Hitachi High-Technologies Corporation
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20190369131
    • Publication date Dec 5, 2019
    • Hitachi High-Technologies Corporation
    • Hiroki AKASE
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20190212351
    • Publication date Jul 11, 2019
    • Hitachi High-Technologies Corporation
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20190072577
    • Publication date Mar 7, 2019
    • Hitachi High-Technologies Corporation
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer
    • Publication number 20180259460
    • Publication date Sep 13, 2018
    • Hitachi High-Technologies Corporation
    • Rei KONISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20170328925
    • Publication date Nov 16, 2017
    • Hitachi High-Technologies Corporation
    • Minoru SANO
    • G01 - MEASURING TESTING