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Reiner Bidenbach
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Vostetten, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Monolithic sensor arrangement and method for controlling a monolith...
Patent number
8,508,216
Issue date
Aug 13, 2013
Micronas GmbH
Reiner Bidenbach
G01 - MEASURING TESTING
Information
Patent Grant
Self-testing sensor apparatus and method
Patent number
8,378,672
Issue date
Feb 19, 2013
Micronas GmbH
Reiner Bidenbach
G01 - MEASURING TESTING
Information
Patent Grant
Communication device and method for improved synchronous data trans...
Patent number
8,249,095
Issue date
Aug 21, 2012
Micronas GmbH
Reiner Bidenbach
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Integrated electronic circuit
Patent number
8,138,750
Issue date
Mar 20, 2012
Micronas GmbH
Hans-Jorg Fink
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor component
Patent number
8,125,070
Issue date
Feb 28, 2012
Micronas GmbH
Stefan Kredler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nonvolatile memory device comprising a programming and deletion che...
Patent number
7,975,191
Issue date
Jul 5, 2011
Micronas GmbH
Manfred Ullrich
G11 - INFORMATION STORAGE
Information
Patent Grant
Digital-to-analog converter circuit layout
Patent number
7,821,438
Issue date
Oct 26, 2010
Micronas, GmbH
Laurent Avon
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Circuit configuration with serial test interface or serial test ope...
Patent number
7,761,756
Issue date
Jul 20, 2010
Micronas GmbH
Reiner Bidenbach
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing a hall magnetic field sensor on a...
Patent number
7,492,178
Issue date
Feb 17, 2009
Micronas GmbH
Reiner Bidenbach
G01 - MEASURING TESTING
Information
Patent Grant
Phase regulating circuit with a time-delay element
Patent number
6,963,234
Issue date
Nov 8, 2005
Micronas GmbH
Reiner Bidenbach
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Analog integrator circuit
Patent number
6,501,322
Issue date
Dec 31, 2002
Micronas GmbH
Reiner Bidenbach
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Signal generator
Patent number
6,300,806
Issue date
Oct 9, 2001
Micronas GmbH
Ulrich Theus
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
DIGITAL-TO-ANALOG CONVERTER CIRCUIT LAYOUT
Publication number
20090295614
Publication date
Dec 3, 2009
Laurent Avon
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Communication Device and Method for Data Transmission
Publication number
20090180497
Publication date
Jul 16, 2009
Micronas GmbH
Reiner Bidenbach
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Monolithically integrated interface circuit
Publication number
20090153187
Publication date
Jun 18, 2009
Micronas GmbH
Reiner Bidenbach
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor Component
Publication number
20090152548
Publication date
Jun 18, 2009
Micronas GmbH
Stefan Kredler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED ELECTRONIC CIRCUIT
Publication number
20090079420
Publication date
Mar 26, 2009
Hans-Jorg Fink
G01 - MEASURING TESTING
Information
Patent Application
Monolithic sensor arrangement and method for controlling a monolith...
Publication number
20080278891
Publication date
Nov 13, 2008
Micronas GmbH
Reiner Bidenbach
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor component and method for testing such a component
Publication number
20080224694
Publication date
Sep 18, 2008
Micronas GmbH
Reiner Bidenbach
G01 - MEASURING TESTING
Information
Patent Application
Circuit configuration with serial test interface or serial test ope...
Publication number
20070294605
Publication date
Dec 20, 2007
Micronas GmbH
Reiner Bidenbach
G01 - MEASURING TESTING
Information
Patent Application
Nonvolatile memory device comprising a programming and deletion che...
Publication number
20070260946
Publication date
Nov 8, 2007
Manfred Ullrich
G11 - INFORMATION STORAGE
Information
Patent Application
Method for testing a hall magnetic field sensor on a wafer
Publication number
20060284612
Publication date
Dec 21, 2006
Reiner Bidenbach
G01 - MEASURING TESTING
Information
Patent Application
Method and circuit for suppressing oscillation modes in ring oscill...
Publication number
20060061426
Publication date
Mar 23, 2006
Reiner Bidenbach
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Phase regulating circuit a time-delay element
Publication number
20040090250
Publication date
May 13, 2004
Reiner Bidenbach
H03 - BASIC ELECTRONIC CIRCUITRY