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Reiner Clement
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Amstetten, DE
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Patents Grants
last 30 patents
Information
Patent Grant
System for measuring the image quality of an optical imaging system
Patent number
9,429,495
Issue date
Aug 30, 2016
Carl Zeiss SMT GmbH
Markus Mengel
G01 - MEASURING TESTING
Information
Patent Grant
System for measuring the image quality of an optical imaging system
Patent number
8,823,948
Issue date
Sep 2, 2014
Carl Zeiss SMT GmbH
Markus Mengel
G01 - MEASURING TESTING
Information
Patent Grant
System for measuring the image quality of an optical imaging system
Patent number
8,488,127
Issue date
Jul 16, 2013
Carl Zeiss SMT GmbH
Markus Mengel
G01 - MEASURING TESTING
Information
Patent Grant
System for measuring the image quality of an optical imaging system
Patent number
7,796,274
Issue date
Sep 14, 2010
Carl Zeiss SMT AG
Markus Mengel
G01 - MEASURING TESTING
Information
Patent Grant
System for measuring the image quality of an optical imaging system
Patent number
7,760,366
Issue date
Jul 20, 2010
Carl Zeiss SMT AG
Markus Mengel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SYSTEM FOR MEASURING THE IMAGE QUALITY OF AN OPTICAL IMAGING SYSTEM
Publication number
20140347654
Publication date
Nov 27, 2014
Markus Mengel
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR MEASURING THE IMAGE QUALITY OF AN OPTICAL IMAGING SYSTEM
Publication number
20130293869
Publication date
Nov 7, 2013
Markus Mengel
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR MEASURING THE IMAGE QUALITY OF AN OPTICAL IMAGING SYSTEM
Publication number
20100315651
Publication date
Dec 16, 2010
Carl Zeiss SMT AG
Markus Mengel
G01 - MEASURING TESTING
Information
Patent Application
System for Measuring the Image Quality of an Optical Imaging System
Publication number
20080252876
Publication date
Oct 16, 2008
Markus Mengel
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR MEASURING THE IMAGE QUALITY OF AN OPTICAL IMAGING SYSTEM
Publication number
20080180688
Publication date
Jul 31, 2008
Carl Zeiss SMT AG
Markus Mengel
G01 - MEASURING TESTING