Reiner G. FENSKE

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Edgartown, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus, system, and methods for weighing and positioning wafers
- Patent number 9,004,838
- Issue date Apr 14, 2015
- Microtronic, Inc.
- Reiner G. Fenske
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, system, and methods for weighing and positioning wafers
- Patent number 8,851,816
- Issue date Oct 7, 2014
- Microtronic, Inc.
- Reiner G. Fenske
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS, SYSTEM, AND METHODS FOR WEIGHING AND POSITIONING WAFERS
- Publication number 20150219486
- Publication date Aug 6, 2015
- MICROTRONIC, INC.
- Reiner G. FENSKE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEM, AND METHOD FOR WAFER CHARACTERIZATION
- Publication number 20120255795
- Publication date Oct 11, 2012
- MICROTRONIC, INC.
- Reiner G. FENSKE
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS, SYSTEM, AND METHOD FOR WAFER CHARACTERIZATION
- Publication number 20120255794
- Publication date Oct 11, 2012
- MICROTRONIC, INC.
- Reiner G. FENSKE
- G01 - MEASURING TESTING