Reiner Maria Jungblut

Person

Taipei City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 11,977,034
- Issue date May 7, 2024
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 10,996,176
- Issue date May 4, 2021
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 10,746,668
- Issue date Aug 18, 2020
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and apparatus for measuring a property of a substrate
- Patent number 9,594,029
- Issue date Mar 14, 2017
- ASML Netherlands B.V.
- Wouter Lodewijk Elings
- G05 - CONTROLLING REGULATING
Information Patent Grant
Lithographic apparatus and device manufacturing method
- Patent number 9,217,916
- Issue date Dec 22, 2015
- ASML Netherlands B.V.
- Paul Christiaan Hinnen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus and device manufacturing method
- Patent number 8,263,296
- Issue date Sep 11, 2012
- ASML Netherlands B.V.
- Paul Christiaan Hinnen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Methods and Apparatus for Measuring a Property of a Substrate
- Publication number 20210215622
- Publication date Jul 15, 2021
- ASML NETHERLANDS B.V.
- Wouter Lodewijk ELINGS
- G05 - CONTROLLING REGULATING
Information Patent Application
Methods and Apparatus for Measuring a Property of a Substrate
- Publication number 20200319118
- Publication date Oct 8, 2020
- ASML NETHERLANDS B.V.
- Wouter Lodewijk ELINGS
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Methods and Apparatus for Measuring a Property of a Substrate
- Publication number 20190301850
- Publication date Oct 3, 2019
- ASML NETHERLANDS B.V.
- Wouter Lodewijk ELINGS
- G01 - MEASURING TESTING
Information Patent Application
Methods and Apparatus for Measuring A Property of a Substrate
- Publication number 20140354969
- Publication date Dec 4, 2014
- ASML NETHERLANDS B.V.
- Wouter Lodewijk Elings
- G01 - MEASURING TESTING
Information Patent Application
Lithographic Apparatus and Device Manufacturing Method
- Publication number 20120300182
- Publication date Nov 29, 2012
- ASML NETHERLANDS B.V.
- Paul Christiaan HINNEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...
- Publication number 20110028004
- Publication date Feb 3, 2011
- ASML NETHERLANDS B.V.
- Jiun-Cheng Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic Apparatus and Device Manufacturing Method
- Publication number 20100233599
- Publication date Sep 16, 2010
- ASML NETHERLANDS B.V.
- Paul Christiaan HINNEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Reiner Maria Jungblut

Person

Patents Grantslast 30 patents

Methods and apparatus for measuring a property of a substrate

Methods and apparatus for measuring a property of a substrate

Methods and apparatus for measuring a property of a substrate

Methods and apparatus for measuring a property of a substrate

Lithographic apparatus and device manufacturing method

Lithographic apparatus and device manufacturing method

Patents Applicationslast 30 patents

Methods and Apparatus for Measuring a Property of a Substrate

Methods and Apparatus for Measuring a Property of a Substrate

Methods and Apparatus for Measuring a Property of a Substrate

Methods and Apparatus for Measuring A Property of a Substrate

Lithographic Apparatus and Device Manufacturing Method

Inspection Method and Apparatus, Lithographic Apparatus, Lithograph...

Lithographic Apparatus and Device Manufacturing Method