Reiner Rygiel

Follow

Person

Altrip, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Confocal laser scanning microscope and a method for investigating a...
- Patent number 8,922,776
- Issue date Dec 30, 2014
- Leica Microsystems CMS GmbH
- Reiner Rygiel
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement for determining the distance, capacitive distance senso...
- Patent number 7,924,027
- Issue date Apr 12, 2011
- Leica Microsytems CMS GmbH
- Frank Sieckmann
- G01 - MEASURING TESTING
Information Patent Grant
Sampler carrier for a confocal microscope and method for fabricatin...
- Patent number 7,583,436
- Issue date Sep 1, 2009
- Leica Microsystems CMS GmbH
- Reiner Rygiel
- G02 - OPTICS
Information Patent Grant
Device and method for adjusting two objective lenses in 4Pi-system
- Patent number 7,477,448
- Issue date Jan 13, 2009
- Leica Microsystems CMS GmbH
- Reiner Rygiel
- G02 - OPTICS
Information Patent Grant
4Pi microscope
- Patent number 7,453,578
- Issue date Nov 18, 2008
- Leica Microsystems CMS GmbH
- Volker Leimbach
- G02 - OPTICS
Information Patent Grant
Beam deflection device
- Patent number 7,177,058
- Issue date Feb 13, 2007
- Leica Microsystems CMS GmbH
- Reiner Rygiel
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
CONFOCAL LASER SCANNING MICROSCOPE AND A METHOD FOR EXAMINING A SAMPLE
- Publication number 20130342834
- Publication date Dec 26, 2013
- Leica Microsystems CMS GmbH
- Reiner Rygiel
- G02 - OPTICS
Information Patent Application
Fine Tuning Device
- Publication number 20080130104
- Publication date Jun 5, 2008
- Leica Microsystems Heidelberg GmbH
- Roland Seifert
- G02 - OPTICS
Information Patent Application
Arrangement for Determining the Distance, Capacitive Distance Senso...
- Publication number 20080068028
- Publication date Mar 20, 2008
- Leica Microsystems CMS GmbH
- Frank Sieckmann
- G01 - MEASURING TESTING
Information Patent Application
Device and method for adjusting two object lenses in 4pi-system
- Publication number 20070153366
- Publication date Jul 5, 2007
- Reiner Rygiel
- G02 - OPTICS
Information Patent Application
4Pi microscope
- Publication number 20070052972
- Publication date Mar 8, 2007
- Leica Microsystems CMS GmbH
- Volker Leimbach
- G02 - OPTICS
Information Patent Application
Beam deflection device
- Publication number 20050036186
- Publication date Feb 17, 2005
- Leica Microsystems Heidelberg GmbH
- Reiner Rygiel
- G02 - OPTICS
Information Patent Application
Sample carrier for a confocal microscope and method for fabricating...
- Publication number 20040087006
- Publication date May 6, 2004
- Leica Microsystems Heidelberg GmbH
- Reiner Rygiel
- G02 - OPTICS