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Reinhart Richter
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Brunntal/Hofolding, DE
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Patents Grants
last 30 patents
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Patent Grant
System for post-processsing of electronic components
Patent number
9,255,965
Issue date
Feb 9, 2016
Multitest Elektronische Systeme GmbH
Reinhart Richter
G01 - MEASURING TESTING
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Patent Grant
System for post-processing of electronic components
Patent number
8,717,048
Issue date
May 6, 2014
Multitest Elektronische Systems GmbH
Reinhart Richter
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SYSTEM FOR POST-PROCESSSING OF ELECTRONIC COMPONENTS
Publication number
20140167798
Publication date
Jun 19, 2014
Multitest elektronische Systeme GmbH
Reinhart Richter
G01 - MEASURING TESTING
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Patent Application
SYSTEM FOR POST-PROCESSING OF ELECTRONIC COMPONENTS
Publication number
20110043231
Publication date
Feb 24, 2011
Reinhart Richter
G01 - MEASURING TESTING