Reiya Ootao

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Tsukuba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Grazing incidence interferometer
- Patent number 8,913,250
- Issue date Dec 16, 2014
- Mitutoyo Corporation
- Reiya Ootao
- G01 - MEASURING TESTING
Information Patent Grant
Grazing incidence interferometer
- Patent number 8,441,650
- Issue date May 14, 2013
- Mitutoyo Corporation
- Yutaka Kuriyama
- G01 - MEASURING TESTING
Information Patent Grant
Oblique incidence interferometer
- Patent number 7,499,178
- Issue date Mar 3, 2009
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GRAZING INCIDENCE INTERFEROMETER
- Publication number 20120327425
- Publication date Dec 27, 2012
- Mitutoyo Corporation
- Reiya Ootao
- G01 - MEASURING TESTING
Information Patent Application
GRAZING INCIDENCE INTERFEROMETER
- Publication number 20110032536
- Publication date Feb 10, 2011
- Mitutoyo Corporation
- Yutaka Kuriyama
- G01 - MEASURING TESTING
Information Patent Application
Oblique incidence interferometer
- Publication number 20100014098
- Publication date Jan 21, 2010
- Mitutoyo Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Application
Oblique incidence interferometer
- Publication number 20080002212
- Publication date Jan 3, 2008
- Mitutoyo Corporation
- Kazuhiko Kawasaki
- G01 - MEASURING TESTING