Remco Schoenmakers

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Best, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method of aligning a charged particle beam apparatus
- Patent number 11,901,155
- Issue date Feb 13, 2024
- FEI Company
- Mykola Kaplenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method implemented by a data processing apparatus, and charged part...
- Patent number 11,861,817
- Issue date Jan 2, 2024
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of examining a sample using a charged particle microscope, w...
- Patent number 11,417,497
- Issue date Aug 16, 2022
- FEI Company
- Remco Schoenmakers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Acquisition strategy for neural network based image restoration
- Patent number 11,100,612
- Issue date Aug 24, 2021
- FEI Company
- Maurice Peemen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of imaging a sample using an electron microscope
- Patent number 10,937,625
- Issue date Mar 2, 2021
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, device and system for remote deep learning for microscopic...
- Patent number 10,903,043
- Issue date Jan 26, 2021
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tomographic imaging method
- Patent number 10,593,068
- Issue date Mar 17, 2020
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interactive graphical representation of image quality and control t...
- Patent number 10,481,378
- Issue date Nov 19, 2019
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle microscope with special aperture plate
- Patent number 9,934,936
- Issue date Apr 3, 2018
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing tomographic imaging of a sample in a charged-p...
- Patent number 9,618,460
- Issue date Apr 11, 2017
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for electron tomography
- Patent number 9,147,551
- Issue date Sep 29, 2015
- FEI Company
- Uwe Luecken
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing tomographic imaging of a sample in a charged-p...
- Patent number 8,912,491
- Issue date Dec 16, 2014
- FEI Company
- Remco Schoenmakers
- G01 - MEASURING TESTING
Information Patent Grant
Detector system for transmission electron microscope
- Patent number 8,338,782
- Issue date Dec 25, 2012
- FBI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD IMPLEMENTED BY A DATA PROCESSING APPARATUS, AND CHARGED PART...
- Publication number 20240095897
- Publication date Mar 21, 2024
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMART SAMPLE CONTAINER FOR COMPLEX SAMPLE EVALUATION WORKFLOWS
- Publication number 20220283197
- Publication date Sep 8, 2022
- FEI Company
- Remco SCHOENMAKERS
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD OF ALIGNING A CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220037111
- Publication date Feb 3, 2022
- FEI Company
- Mykola KAPLENKO
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD IMPLEMENTED BY A DATA PROCESSING APPARATUS, AND CHARGED PART...
- Publication number 20210327677
- Publication date Oct 21, 2021
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method, device and system for remote deep learning for microscopic...
- Publication number 20210151289
- Publication date May 20, 2021
- FEI Company
- Remco SCHOENMAKERS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE, W...
- Publication number 20200395192
- Publication date Dec 17, 2020
- FEI Company
- Remco Schoenmakers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACQUISITION STRATEGY FOR NEURAL NETWORK BASED IMAGE RESTORATION
- Publication number 20200357097
- Publication date Nov 12, 2020
- FEI Company
- Maurice Peemen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF IMAGING A SAMPLE USING AN ELECTRON MICROSCOPE
- Publication number 20200168433
- Publication date May 28, 2020
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBJECT TRACKING USING IMAGE SEGMENTATION
- Publication number 20200111219
- Publication date Apr 9, 2020
- FEI Company
- Pavel Potocek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method, device and system for remote deep learning for microscopic...
- Publication number 20190287761
- Publication date Sep 19, 2019
- FEI Company
- Remco SCHOENMAKERS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOMOGRAPHIC IMAGING METHOD
- Publication number 20180082444
- Publication date Mar 22, 2018
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE MICROSCOPE WITH SPECIAL APERTURE PLATE
- Publication number 20160111247
- Publication date Apr 21, 2016
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Electron Tomography
- Publication number 20150069231
- Publication date Mar 12, 2015
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PERFORMING TOMOGRAPHIC IMAGING OF A SAMPLE IN A CHARGED-P...
- Publication number 20140145077
- Publication date May 29, 2014
- FEI Company
- Remco Schoenmakers
- G01 - MEASURING TESTING
Information Patent Application
Method of Performing Tomographic Imaging of a Sample in a Charged-P...
- Publication number 20140070095
- Publication date Mar 13, 2014
- FEI Company
- Remco Schoenmakers
- G01 - MEASURING TESTING
Information Patent Application
Detector System for Transmission Electron Microscope
- Publication number 20120049061
- Publication date Mar 1, 2012
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS

Remco Schoenmakers

Person

Patents Grantslast 30 patents

Method of aligning a charged particle beam apparatus

Method implemented by a data processing apparatus, and charged part...

Method of examining a sample using a charged particle microscope, w...

Acquisition strategy for neural network based image restoration

Method of imaging a sample using an electron microscope

Method, device and system for remote deep learning for microscopic...

Tomographic imaging method

Interactive graphical representation of image quality and control t...

Charged particle microscope with special aperture plate

Method of performing tomographic imaging of a sample in a charged-p...

Method for electron tomography

Method of performing tomographic imaging of a sample in a charged-p...

Detector system for transmission electron microscope

Patents Applicationslast 30 patents

METHOD IMPLEMENTED BY A DATA PROCESSING APPARATUS, AND CHARGED PART...

SMART SAMPLE CONTAINER FOR COMPLEX SAMPLE EVALUATION WORKFLOWS

METHOD OF ALIGNING A CHARGED PARTICLE BEAM APPARATUS

METHOD IMPLEMENTED BY A DATA PROCESSING APPARATUS, AND CHARGED PART...

Method, device and system for remote deep learning for microscopic...

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE, W...

ACQUISITION STRATEGY FOR NEURAL NETWORK BASED IMAGE RESTORATION

METHOD OF IMAGING A SAMPLE USING AN ELECTRON MICROSCOPE

OBJECT TRACKING USING IMAGE SEGMENTATION

Method, device and system for remote deep learning for microscopic...

TOMOGRAPHIC IMAGING METHOD

CHARGED PARTICLE MICROSCOPE WITH SPECIAL APERTURE PLATE

Method for Electron Tomography

METHOD OF PERFORMING TOMOGRAPHIC IMAGING OF A SAMPLE IN A CHARGED-P...

Method of Performing Tomographic Imaging of a Sample in a Charged-P...

Detector System for Transmission Electron Microscope