Remi Thollot

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Cruseilles, FR

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Patents Grantslast 30 patents

Information Patent Grant
Method and device for monitoring the contamination of substrate wafers
- Patent number 7,790,479
- Issue date Sep 7, 2010
- Alcatel
- Arnaud Favre
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and device for monitoring the contamination of substrate wafers
- Publication number 20060292037
- Publication date Dec 28, 2006
- ALCATEL
- Arnaud Favre
- H01 - BASIC ELECTRIC ELEMENTS