Ren Uchida

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, semiconductor device testing method, and prob...
- Patent number 7,902,853
- Issue date Mar 8, 2011
- Sharp Kabushiki Kaisha
- Ren Uchida
- G01 - MEASURING TESTING
Information Patent Grant
Testing method and testing device for semiconductor integrated circ...
- Patent number 6,879,174
- Issue date Apr 12, 2005
- Sharp Kabushiki Kaisha
- Ren Uchida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF REMOVING PANEL FROM SUCTION SURFACE, METHOD OF PRODUCING...
- Publication number 20200041828
- Publication date Feb 6, 2020
- Sharp Kabushiki Kaisha
- EIJI TSUTSUMI
- G02 - OPTICS
Information Patent Application
MULTI-CHIP PROBER, CONTACT POSITION CORRECTION METHOD THEREOF, AND...
- Publication number 20130169300
- Publication date Jul 4, 2013
- SUN-S, CO., LTD.
- Shinji ISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device, semiconductor device testing method, and prob...
- Publication number 20070296395
- Publication date Dec 27, 2007
- Sharp Kabushiki Kaisha
- Ren Uchida
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS