Rene Hubert Jacobus Carpaij

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Vught, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method to determine the value of process parameters based on scatte...
- Patent number 8,773,657
- Issue date Jul 8, 2014
- ASML Netherlands B.V.
- Hans Van Der Laan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method to Determine the Value of Process Parameters BAsed on Scatte...
- Publication number 20070222979
- Publication date Sep 27, 2007
- ASML NETHERLANDS B.V.
- Hans Van Der Laan
- G01 - MEASURING TESTING
Information Patent Application
Lithographic apparatus and device manufacturing method
- Publication number 20050264790
- Publication date Dec 1, 2005
- ASML NETHERLANDS B.V.
- Maurice Henricus Franciscus Janssen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method to determine the value of process parameters based on scatte...
- Publication number 20050185174
- Publication date Aug 25, 2005
- ASML NETHERLANDS B.V.
- Hans Van Der Laan
- G01 - MEASURING TESTING