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Rene Schenck
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Jena, DE
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Patents Grants
last 30 patents
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Patent Grant
System for inspecting a disk-shaped object
Patent number
7,426,024
Issue date
Sep 16, 2008
Vistec Semiconductor Systems Jena GmbH
René Schenck
G01 - MEASURING TESTING
Information
Patent Grant
System for the detection of macrodefects
Patent number
7,265,823
Issue date
Sep 4, 2007
Vistec Semiconductor Systems GmbH
Albert Kreh
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Device for holding disk-shaped objects
Publication number
20090309285
Publication date
Dec 17, 2009
Vistec Semiconductor Systems Jena GmbH
Rene Schenck
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of determining geometric parameters of a wafer
Publication number
20080208523
Publication date
Aug 28, 2008
Vistec Semiconductor Systems GmbH
Rene Schenck
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for holding disk-like objects
Publication number
20080203636
Publication date
Aug 28, 2008
VISTEC Semiconductor Systems Jena GmbH
Rene Schenck
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
Device for handling disk-like objects
Publication number
20070077136
Publication date
Apr 5, 2007
Vistec Semiconductor Systems GmbH
Rene Schenck
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for determining the lateral offset of an XYZ stage
Publication number
20060239507
Publication date
Oct 26, 2006
Leica Microsystems CMS GmbH
Rene Schenck
G02 - OPTICS
Information
Patent Application
Apparatus for Inspecting the front side and backside of a disk-shap...
Publication number
20060119367
Publication date
Jun 8, 2006
Leica Microsystems Jena GmbH
Thomas Iffland
G01 - MEASURING TESTING
Information
Patent Application
System for the detection of macrodefects
Publication number
20050101036
Publication date
May 12, 2005
LEICA MICROSYSTEMS
Albert Kreh
H01 - BASIC ELECTRIC ELEMENTS