Renichi YAMADA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor inspection method, semiconductor inspection device an...
- Patent number 9,508,611
- Issue date Nov 29, 2016
- Hitachi, Ltd.
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic random access memories and method for testing performance o...
- Patent number 7,450,458
- Issue date Nov 11, 2008
- Hitachi, Ltd.
- Yuki Mori
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,247,890
- Issue date Jul 24, 2007
- Hitachi, Ltd.
- Tomoko Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INSPECTION METHOD, SEMICONDUCTOR INSPECTION DEVICE AN...
- Publication number 20160190020
- Publication date Jun 30, 2016
- Hitachi, Ltd
- Yoshinobu KIMURA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE, AND INSPECTION METHOD USING CHARGE...
- Publication number 20150303030
- Publication date Oct 22, 2015
- Hitachi, Ltd
- Yoshinobu Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic random access memories and method for testing performance o...
- Publication number 20060203590
- Publication date Sep 14, 2006
- Yuki Mori
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and manufacturing method thereof
- Publication number 20050098813
- Publication date May 12, 2005
- Tomoko Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS