Renn-Shyan Yeh

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Taichun, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for yield loss analysis by yield management system
- Patent number 6,389,323
- Issue date May 14, 2002
- Taiwan Semiconductor Manufacturing Company
- Jiunn-Der Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining stress effect on a film during scrubber clean
- Patent number 6,308,576
- Issue date Oct 30, 2001
- Taiwan Semiconductor Manufacturing Company, Ltd
- Renn-Shyan Yeh
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining a cause for defects in a film deposited on a...
- Patent number 6,153,497
- Issue date Nov 28, 2000
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Renn-Shyan Yeh
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for yield loss analysis by yield management system
- Patent number 6,017,771
- Issue date Jan 25, 2000
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jiunn-Der Yang
- H01 - BASIC ELECTRIC ELEMENTS