Reum Oh

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device and method of adjusting operation condi...
- Patent number 12,299,296
- Issue date May 13, 2025
- Samsung Electronics Co., Ltd.
- Seunghyun Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device using different types of through-silicon-vias
- Patent number 12,250,807
- Issue date Mar 11, 2025
- Samsung Electronics Co., Ltd.
- Jaesan Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer level methods of testing semiconductor devices using internal...
- Patent number 12,203,980
- Issue date Jan 21, 2025
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level methods of testing semiconductor devices using internal...
- Patent number 11,867,751
- Issue date Jan 9, 2024
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Grant
High bandwidth memory device and system device having the same
- Patent number 11,681,457
- Issue date Jun 20, 2023
- Samsung Electronics Co., Ltd.
- Jun Gyu Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device and system including the same
- Patent number 11,599,301
- Issue date Mar 7, 2023
- Samsung Electronics Co., Ltd.
- Haesuk Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and semiconductor package including the semico...
- Patent number 11,538,506
- Issue date Dec 27, 2022
- Samsung Electronics Co., Ltd.
- Hyungjin Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer level methods of testing semiconductor devices using internal...
- Patent number 11,435,397
- Issue date Sep 6, 2022
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Grant
High bandwidth memory device and system device having the same
- Patent number 11,334,282
- Issue date May 17, 2022
- Samsung Electronics Co., Ltd.
- Jun Gyu Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor die for determining load of through silicon via and s...
- Patent number 11,239,210
- Issue date Feb 1, 2022
- Samsung Electronics Co., Ltd.
- SeungHan Woo
- G01 - MEASURING TESTING
Information Patent Grant
High bandwidth memory device and system device having the same
- Patent number 11,194,505
- Issue date Dec 7, 2021
- Samsung Electronics Co., Ltd.
- Jun Gyu Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High bandwidth memory device and system device having the same
- Patent number 10,996,885
- Issue date May 4, 2021
- Samsung Electronics Co., Ltd.
- Jun Gyu Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor die for determining load of through silicon via and s...
- Patent number 10,916,525
- Issue date Feb 9, 2021
- Samsung Electronics Co., Ltd.
- SeungHan Woo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stacked memory device and a memory chip including the same
- Patent number 10,768,824
- Issue date Sep 8, 2020
- Samsung Electronics Co., Ltd.
- Hak-Soo Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device sampling data using control signal transmitted throug...
- Patent number 10,740,033
- Issue date Aug 11, 2020
- Samsung Electronics Co., Ltd.
- So-young Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device comprising status circuit and operating method thereof
- Patent number 10,671,464
- Issue date Jun 2, 2020
- Samsung Electronics Co., Ltd.
- Moonhee Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device and method of operating a semiconductor...
- Patent number 10,592,467
- Issue date Mar 17, 2020
- Samsung Electronics Co., Ltd.
- Je Min Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device for performing internal process and operating method...
- Patent number 10,410,685
- Issue date Sep 10, 2019
- Samsung Electronics Co., Ltd.
- Reum Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stacked semiconductor device and system including the same
- Patent number 10,373,661
- Issue date Aug 6, 2019
- Samsung Electronics Co., Ltd.
- Hae-Suk Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Stacked memory device and a memory chip including the same
- Patent number 10,331,354
- Issue date Jun 25, 2019
- Samsung Electronics Co., Ltd.
- Hak-Soo Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device for performing internal process and operating method...
- Patent number 10,262,699
- Issue date Apr 16, 2019
- Samsung Electronics Co., Ltd.
- Reum Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus, stack semiconductor apparatus, and test me...
- Patent number 10,241,150
- Issue date Mar 26, 2019
- Samsung Electronics Co., Ltd.
- Seung-han Woo
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device using a parallel bit operation and method of o...
- Patent number 10,224,114
- Issue date Mar 5, 2019
- Samsung Electronics Co., Ltd.
- Je-min Ryu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device for performing internal process and operating method...
- Patent number 10,083,722
- Issue date Sep 25, 2018
- Samsung Electronics Co., Ltd.
- Reum Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device having reduced power consumption during...
- Patent number 8,228,748
- Issue date Jul 24, 2012
- Samsung Electronics Co., Ltd.
- Taek-Seon Park
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 8,107,308
- Issue date Jan 31, 2012
- Samsung Electronics Co., Ltd.
- Myeong-O Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Latency control circuit and method thereof and an auto-precharge co...
- Patent number 7,911,862
- Issue date Mar 22, 2011
- Samsung Electronics Co., Ltd.
- Joung-Yeal Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory systems, on-die termination (ODT) circuits, and method of OD...
- Patent number 7,786,752
- Issue date Aug 31, 2010
- Samsung Electronics Co., Ltd.
- Reum Oh
- G11 - INFORMATION STORAGE
Information Patent Grant
Latency control circuit and method thereof and an auto-precharge co...
- Patent number 7,609,584
- Issue date Oct 27, 2009
- Samsung Electronics Co., Ltd.
- Joung-Yeal Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for determining on die termination modes in me...
- Patent number 7,436,204
- Issue date Oct 14, 2008
- Samsung Electronics Co., Ltd.
- Sung-Ho Choi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE USING DIFFERENT TYPES OF THROUGH-SILICON-VIAS
- Publication number 20250169067
- Publication date May 22, 2025
- Samsung Electronics Co., Ltd.
- Jaesan Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNAL...
- Publication number 20240012045
- Publication date Jan 11, 2024
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME
- Publication number 20230289072
- Publication date Sep 14, 2023
- Samsung Electronics Co., Ltd.
- Seunghyun Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNAL...
- Publication number 20220357393
- Publication date Nov 10, 2022
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Application
HIGH BANDWIDTH MEMORY DEVICE AND SYSTEM DEVICE HAVING THE SAME
- Publication number 20220244882
- Publication date Aug 4, 2022
- Samsung Electronics Co., Ltd.
- JUN GYU LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE USING DIFFERENT TYPES OF THROUGH-SILICON-VIAS
- Publication number 20220130841
- Publication date Apr 28, 2022
- Samsung Electronics Co., Ltd.
- Jaesan Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND SYSTEM INCLUDING THE SAME
- Publication number 20220083260
- Publication date Mar 17, 2022
- Samsung Electronics Co., Ltd.
- Haesuk LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SEMICO...
- Publication number 20220028431
- Publication date Jan 27, 2022
- Samsung Electronics Co., Ltd.
- Hyungjin Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH BANDWIDTH MEMORY DEVICE AND SYSTEM DEVICE HAVING THE SAME
- Publication number 20210165597
- Publication date Jun 3, 2021
- Samsung Electronics Co., Ltd.
- JUN GYU LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH BANDWIDTH MEMORY DEVICE AND SYSTEM DEVICE HAVING THE SAME
- Publication number 20210165596
- Publication date Jun 3, 2021
- Samsung Electronics Co., Ltd.
- JUN GYU LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DIE FOR DETERMINING LOAD OF THROUGH SILICON VIA AND S...
- Publication number 20210104498
- Publication date Apr 8, 2021
- Samsung Electronics Co., Ltd.
- SeungHan WOO
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNAL...
- Publication number 20200371157
- Publication date Nov 26, 2020
- Samsung Electronics Co., Ltd.
- Ahn Choi
- G01 - MEASURING TESTING
Information Patent Application
MEMORY DEVICE SAMPLING DATA USING CONTROL SIGNAL TRANSMITTED THROUG...
- Publication number 20190303042
- Publication date Oct 3, 2019
- Samsung Electronics Co., Ltd.
- So-young KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DIE FOR DETERMINING LOAD OF THROUGH SILICON VIA AND S...
- Publication number 20190279963
- Publication date Sep 12, 2019
- Samsung Electronics Co., Ltd.
- SeungHan WOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH BANDWIDTH MEMORY DEVICE AND SYSTEM DEVICE HAVING THE SAME
- Publication number 20190278511
- Publication date Sep 12, 2019
- Samsung Electronics Co., Ltd.
- JUN GYU LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STACKED MEMORY DEVICE AND A MEMORY CHIP INCLUDING THE SAME
- Publication number 20190272100
- Publication date Sep 5, 2019
- SAMSUNG ELECTRONICS., LTD.
- HAK-SOO YU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE FOR PERFORMING INTERNAL PROCESS AND OPERATING METHOD...
- Publication number 20190198061
- Publication date Jun 27, 2019
- Samsung Electronics Co., Ltd.
- REUM OH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE FOR PERFORMING INTERNAL PROCESS AND OPERATING METHOD...
- Publication number 20180358055
- Publication date Dec 13, 2018
- Samsung Electronics Co., Ltd.
- REUM OH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE COMPRISING STATUS CIRCUIT AND OPERATING METHOD THEREOF
- Publication number 20180189127
- Publication date Jul 5, 2018
- Samsung Electronics Co., Ltd.
- Moonhee Oh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STACKED MEMORY DEVICE AND A MEMORY CHIP INCLUDING THE SAME
- Publication number 20180032252
- Publication date Feb 1, 2018
- Samsung Electronics Co., Ltd.
- HAK-SOO YU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE FOR PERFORMING INTERNAL PROCESS AND OPERATING METHOD...
- Publication number 20170358327
- Publication date Dec 14, 2017
- Samsung Electronics Co., Ltd.
- REUM OH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STACKED SEMICONDUCTOR DEVICE AND SYSTEM INCLUDING THE SAME
- Publication number 20170352392
- Publication date Dec 7, 2017
- Samsung Electronics Co., Ltd.
- HAE-SUK LEE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE USING A PARALLEL BIT OPERATION AND METHOD OF O...
- Publication number 20170352434
- Publication date Dec 7, 2017
- Samsung Electronics Co., Ltd.
- Je-min RYU
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND OPERATION METHOD THEREOF
- Publication number 20170344301
- Publication date Nov 30, 2017
- Samsung Electronics Co., Ltd.
- JE MIN RYU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR APPARATUS, STACK SEMICONDUCTOR APPARATUS, AND TEST ME...
- Publication number 20170059648
- Publication date Mar 2, 2017
- Samsung Electronics Co., Ltd.
- Seung-han WOO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE HAVING REDUCED POWER CONSUMPTION DURING...
- Publication number 20100265780
- Publication date Oct 21, 2010
- Samsung Electronics Co., Ltd.
- Taek-Seon PARK
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor Memory Device
- Publication number 20100177582
- Publication date Jul 15, 2010
- Myeong-O Kim
- G11 - INFORMATION STORAGE
Information Patent Application
Latency Control Circuit and Method Thereof and an Auto-Precharge Co...
- Publication number 20100008169
- Publication date Jan 14, 2010
- Samsung Electronics Co., Ltd.
- Joung-Yeal Kim
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEMS, ON-DIE TERMINATION (ODT) CIRCUITS, AND METHOD OF OD...
- Publication number 20080159026
- Publication date Jul 3, 2008
- Samsung Electronics Co., Ltd.
- Reum OH
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Apparatus and method for determining on die termination modes in me...
- Publication number 20080100335
- Publication date May 1, 2008
- Sung-Ho Choi
- H03 - BASIC ELECTRONIC CIRCUITRY

Person

Patents Grantslast 30 patents

Semiconductor memory device and method of adjusting operation condi...

Semiconductor device using different types of through-silicon-vias

Wafer level methods of testing semiconductor devices using internal...

Wafer level methods of testing semiconductor devices using internal...

High bandwidth memory device and system device having the same

Semiconductor memory device and system including the same

Semiconductor device and semiconductor package including the semico...

Wafer level methods of testing semiconductor devices using internal...

High bandwidth memory device and system device having the same

Semiconductor die for determining load of through silicon via and s...

High bandwidth memory device and system device having the same

High bandwidth memory device and system device having the same

Semiconductor die for determining load of through silicon via and s...

Stacked memory device and a memory chip including the same

Memory device sampling data using control signal transmitted throug...

Memory device comprising status circuit and operating method thereof

Semiconductor memory device and method of operating a semiconductor...

Memory device for performing internal process and operating method...

Stacked semiconductor device and system including the same

Stacked memory device and a memory chip including the same

Memory device for performing internal process and operating method...

Semiconductor apparatus, stack semiconductor apparatus, and test me...

Semiconductor device using a parallel bit operation and method of o...

Memory device for performing internal process and operating method...

Semiconductor memory device having reduced power consumption during...

Semiconductor memory device

Latency control circuit and method thereof and an auto-precharge co...

Memory systems, on-die termination (ODT) circuits, and method of OD...

Latency control circuit and method thereof and an auto-precharge co...

Apparatus and method for determining on die termination modes in me...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE USING DIFFERENT TYPES OF THROUGH-SILICON-VIAS

WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNAL...

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME

WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNAL...

HIGH BANDWIDTH MEMORY DEVICE AND SYSTEM DEVICE HAVING THE SAME

SEMICONDUCTOR DEVICE USING DIFFERENT TYPES OF THROUGH-SILICON-VIAS

SEMICONDUCTOR MEMORY DEVICE AND SYSTEM INCLUDING THE SAME

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SEMICO...

HIGH BANDWIDTH MEMORY DEVICE AND SYSTEM DEVICE HAVING THE SAME

HIGH BANDWIDTH MEMORY DEVICE AND SYSTEM DEVICE HAVING THE SAME

SEMICONDUCTOR DIE FOR DETERMINING LOAD OF THROUGH SILICON VIA AND S...

WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNAL...

MEMORY DEVICE SAMPLING DATA USING CONTROL SIGNAL TRANSMITTED THROUG...

SEMICONDUCTOR DIE FOR DETERMINING LOAD OF THROUGH SILICON VIA AND S...

HIGH BANDWIDTH MEMORY DEVICE AND SYSTEM DEVICE HAVING THE SAME

STACKED MEMORY DEVICE AND A MEMORY CHIP INCLUDING THE SAME

MEMORY DEVICE FOR PERFORMING INTERNAL PROCESS AND OPERATING METHOD...

MEMORY DEVICE FOR PERFORMING INTERNAL PROCESS AND OPERATING METHOD...

MEMORY DEVICE COMPRISING STATUS CIRCUIT AND OPERATING METHOD THEREOF

STACKED MEMORY DEVICE AND A MEMORY CHIP INCLUDING THE SAME

MEMORY DEVICE FOR PERFORMING INTERNAL PROCESS AND OPERATING METHOD...

STACKED SEMICONDUCTOR DEVICE AND SYSTEM INCLUDING THE SAME

SEMICONDUCTOR DEVICE USING A PARALLEL BIT OPERATION AND METHOD OF O...

SEMICONDUCTOR MEMORY DEVICE AND OPERATION METHOD THEREOF

SEMICONDUCTOR APPARATUS, STACK SEMICONDUCTOR APPARATUS, AND TEST ME...

SEMICONDUCTOR MEMORY DEVICE HAVING REDUCED POWER CONSUMPTION DURING...

Semiconductor Memory Device

Latency Control Circuit and Method Thereof and an Auto-Precharge Co...

MEMORY SYSTEMS, ON-DIE TERMINATION (ODT) CIRCUITS, AND METHOD OF OD...

Apparatus and method for determining on die termination modes in me...