Rex RUNYON

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interleaved acousto-optical device scanning for suppression of opti...
- Patent number 10,060,884
- Issue date Aug 28, 2018
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,645,093
- Issue date May 9, 2017
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Grant
Interleaved acousto-optical device scanning for suppression of opti...
- Patent number 9,395,340
- Issue date Jul 19, 2016
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for apodization in a semiconductor device inspect...
- Patent number 9,176,069
- Issue date Nov 3, 2015
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam column and methods of using same
- Patent number 8,461,526
- Issue date Jun 11, 2013
- KLA-Tencor Corporation
- Marian Mankos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-sensitivity and high-throughput electron beam inspection colum...
- Patent number 8,294,125
- Issue date Oct 23, 2012
- KLA-Tencor Corporation
- Liqun Han
- G01 - MEASURING TESTING
Information Patent Grant
Multi-spot scanning system and method
- Patent number 8,194,301
- Issue date Jun 5, 2012
- KLA-Tencor Corporation
- Guoheng Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional UV compatible programmable spatial filter
- Patent number 6,686,995
- Issue date Feb 3, 2004
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G01 - MEASURING TESTING
Information Patent Grant
UV compatible programmable spatial filter
- Patent number 6,686,994
- Issue date Feb 3, 2004
- KLA-Tencor Technologies Corporation
- Dieter Wilk
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...
- Publication number 20160290971
- Publication date Oct 6, 2016
- KLA-Tencor Corporation
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20160054232
- Publication date Feb 25, 2016
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...
- Publication number 20140260640
- Publication date Sep 18, 2014
- KLA-Tencor Corporation Drive
- Jamie Sullivan
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Apodization in a Semiconductor Device Inspect...
- Publication number 20140016125
- Publication date Jan 16, 2014
- KLA-Tencor Corporation
- Jamie M. Sullivan
- G02 - OPTICS
Information Patent Application
ELECTRON BEAM COLUMN AND METHODS OF USING SAME
- Publication number 20120138791
- Publication date Jun 7, 2012
- Marian MANKOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High-Sensitivity and High-Throughput Electron Beam Inspection Colum...
- Publication number 20110114838
- Publication date May 19, 2011
- Liqun HAN
- G01 - MEASURING TESTING
Information Patent Application
Multi-spot scanning system and method
- Publication number 20090225399
- Publication date Sep 10, 2009
- KLA-Tencor Corporation
- Guoheng Zhao
- G02 - OPTICS
Information Patent Application
TWO-DIMENSIONAL UV COMPATIBLE PROGRAMMABLE SPATIAL FILTER
- Publication number 20040001198
- Publication date Jan 1, 2004
- KLA-Tencor Technologies Corporation
- Dieter E. Wilk
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Interleaved acousto-optical device scanning for suppression of opti...

System and method for apodization in a semiconductor device inspect...

Interleaved acousto-optical device scanning for suppression of opti...

System and method for apodization in a semiconductor device inspect...

Electron beam column and methods of using same

High-sensitivity and high-throughput electron beam inspection colum...

Multi-spot scanning system and method

Two-dimensional UV compatible programmable spatial filter

UV compatible programmable spatial filter

Patents Applicationslast 30 patents

Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...

System and Method for Apodization in a Semiconductor Device Inspect...

Interleaved Acousto-Optical Device Scanning For Suppression Of Opti...

System and Method for Apodization in a Semiconductor Device Inspect...

ELECTRON BEAM COLUMN AND METHODS OF USING SAME

High-Sensitivity and High-Throughput Electron Beam Inspection Colum...

Multi-spot scanning system and method

TWO-DIMENSIONAL UV COMPATIBLE PROGRAMMABLE SPATIAL FILTER