Reza Kharrazian

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Stephanskirchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for inspecting bonded wafers
- Patent number 9,355,919
- Issue date May 31, 2016
- Nanda Technologies GmbH
- Markus Estermann
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting and processing semiconductor wafers
- Patent number 8,778,702
- Issue date Jul 15, 2014
- Nanda Technologies GmbH
- Lars Markwort
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR INSPECTING BONDED WAFERS
- Publication number 20130157391
- Publication date Jun 20, 2013
- Nanda Technologies GmbH
- Markus Estermann
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING AND PROCESSING SEMICONDUCTOR WAFERS
- Publication number 20120142122
- Publication date Jun 7, 2012
- Lars Markwort
- G01 - MEASURING TESTING