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Ric DeHoff
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Hillsboro, OR, US
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last 30 patents
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Patent Grant
Wafer carrier mapping sensor assembly
Patent number
6,897,463
Issue date
May 24, 2005
CyberOptics Semiconductor, Inc.
Samuel J. Cole
G01 - MEASURING TESTING
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Patent Grant
System for mapping wafers using predictive dynamic lighting
Patent number
6,825,486
Issue date
Nov 30, 2004
CyberOptics Corporation
Samuel J. Cole
G06 - COMPUTING CALCULATING COUNTING