Ricardo Rodriguez

Person

Mill Creek, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Non-contact voltage measurement with adjustable size rogowski coil
- Patent number 12,061,213
- Issue date Aug 13, 2024
- Fluke Corporation
- Ginger M. Woo
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact voltage measurement with adjustable size Rogowski coil
- Patent number 11,662,368
- Issue date May 30, 2023
- Fluke Corporation
- Ginger M. Woo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Sensor probe with clamp having adjustable interior region for non-c...
- Patent number 11,513,140
- Issue date Nov 29, 2022
- Fluke Corporation
- Ginger M. Woo
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact current measurement system
- Patent number 11,237,192
- Issue date Feb 1, 2022
- Fluke Corporation
- Ricardo Rodriguez
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact DC voltage measurement device with oscillating sensor
- Patent number 11,209,480
- Issue date Dec 28, 2021
- Fluke Corporation
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact DC voltage measurement device with oscillating sensor
- Patent number 10,802,072
- Issue date Oct 13, 2020
- Fluke Corporation
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable length Rogowski coil measurement device with non-contact...
- Patent number 10,746,767
- Issue date Aug 18, 2020
- Fluke Corporation
- Jeffrey Worones
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Position dependent non-contact voltage and current measurement
- Patent number 10,677,876
- Issue date Jun 9, 2020
- Fluke Corporation
- Christian Karl Schmitzer
- G01 - MEASURING TESTING
Information Patent Grant
Sensor subsystems for non-contact voltage measurement devices
- Patent number 10,605,832
- Issue date Mar 31, 2020
- Fluke Corporation
- David L. Epperson
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact current measurement system
- Patent number 10,591,515
- Issue date Mar 17, 2020
- Fluke Corporation
- Ricardo Rodriguez
- G01 - MEASURING TESTING
Information Patent Grant
Multi-sensor scanner configuration for non-contact voltage measurem...
- Patent number 10,557,875
- Issue date Feb 11, 2020
- Fluke Corporation
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Grant
Multi-sensor configuration for non-contact voltage measurement devices
- Patent number 10,551,416
- Issue date Feb 4, 2020
- Fluke Corporation
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Grant
Proving unit for non-contact voltage measurement systems
- Patent number 10,359,494
- Issue date Jul 23, 2019
- Fluke Corporation
- David L. Epperson
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Non-contact electrical parameter measurement systems
- Patent number 10,352,967
- Issue date Jul 16, 2019
- Fluke Corporation
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Grant
Proving unit for voltage measurement systems
- Patent number 10,254,375
- Issue date Apr 9, 2019
- Fluke Corporation
- David L. Epperson
- G01 - MEASURING TESTING
Information Patent Grant
Magnetically coupled ground reference probe
- Patent number 9,933,459
- Issue date Apr 3, 2018
- Fluke Corporation
- David L. Epperson
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent lamp testing device
- Patent number 9,651,606
- Issue date May 16, 2017
- Fluke Corporation
- Matthew B. Marzynski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-CONTACT VOLTAGE MEASUREMENT WITH ADJUSTABLE SIZE ROGOWSKI COIL
- Publication number 20230251289
- Publication date Aug 10, 2023
- FLUKE CORPORATION
- Ginger M. Woo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NON-CONTACT VOLTAGE MEASUREMENT WITH ADJUSTABLE SIZE ROGOWSKI COIL
- Publication number 20210239740
- Publication date Aug 5, 2021
- FLUKE CORPORATION
- Ginger M. Woo
- G01 - MEASURING TESTING
Information Patent Application
SENSOR PROBE WITH CLAMP HAVING ADJUSTABLE INTERIOR REGION FOR NON-C...
- Publication number 20210239741
- Publication date Aug 5, 2021
- FLUKE CORPORATION
- Ginger M. Woo
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT DC VOLTAGE MEASUREMENT DEVICE WITH OSCILLATING SENSOR
- Publication number 20200408836
- Publication date Dec 31, 2020
- FLUKE CORPORATION
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT CURRENT MEASUREMENT SYSTEM
- Publication number 20200191836
- Publication date Jun 18, 2020
- FLUKE CORPORATION
- Ricardo Rodriguez
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SENSOR CONFIGURATION FOR NON-CONTACT VOLTAGE MEASUREMENT DEVICES
- Publication number 20190346493
- Publication date Nov 14, 2019
- FLUKE CORPORATION
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Application
POSITION DEPENDENT NON-CONTACT VOLTAGE AND CURRENT MEASUREMENT
- Publication number 20190346529
- Publication date Nov 14, 2019
- FLUKE CORPORATION
- Christian Karl Schmitzer
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SENSOR SCANNER CONFIGURATION FOR NON-CONTACT VOLTAGE MEASUREM...
- Publication number 20190346494
- Publication date Nov 14, 2019
- FLUKE CORPORATION
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE LENGTH ROGOWSKI COIL MEASUREMENT DEVICE WITH NON-CONTACT...
- Publication number 20190346492
- Publication date Nov 14, 2019
- FLUKE CORPORATION
- Jeffrey Worones
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT DC VOLTAGE MEASUREMENT DEVICE WITH OSCILLATING SENSOR
- Publication number 20190346502
- Publication date Nov 14, 2019
- FLUKE CORPORATION
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT CURRENT MEASUREMENT SYSTEM
- Publication number 20180136260
- Publication date May 17, 2018
- FLUKE CORPORATION
- Ricardo Rodriguez
- G01 - MEASURING TESTING
Information Patent Application
PROVING UNIT FOR NON-CONTACT VOLTAGE MEASUREMENT SYSTEMS
- Publication number 20180136302
- Publication date May 17, 2018
- FLUKE CORPORATION
- David L. Epperson
- G01 - MEASURING TESTING
Information Patent Application
PROVING UNIT FOR VOLTAGE MEASUREMENT SYSTEMS
- Publication number 20180136303
- Publication date May 17, 2018
- FLUKE CORPORATION
- David L. Epperson
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT SYSTEMS
- Publication number 20180136257
- Publication date May 17, 2018
- FLUKE CORPORATION
- Ronald Steuer
- G01 - MEASURING TESTING
Information Patent Application
SENSOR SUBSYSTEMS FOR NON-CONTACT VOLTAGE MEASUREMENT DEVICES
- Publication number 20180136259
- Publication date May 17, 2018
- FLUKE CORPORATION
- David L. Epperson
- G01 - MEASURING TESTING
Information Patent Application
FLUORESCENT LAMP TESTING DEVICE
- Publication number 20150362545
- Publication date Dec 17, 2015
- FLUKE CORPORATION
- Matthew B. Marzynski
- G01 - MEASURING TESTING

Ricardo Rodriguez

Person

Patents Grantslast 30 patents

Non-contact voltage measurement with adjustable size rogowski coil

Non-contact voltage measurement with adjustable size Rogowski coil

Sensor probe with clamp having adjustable interior region for non-c...

Non-contact current measurement system

Non-contact DC voltage measurement device with oscillating sensor

Non-contact DC voltage measurement device with oscillating sensor

Adjustable length Rogowski coil measurement device with non-contact...

Position dependent non-contact voltage and current measurement

Sensor subsystems for non-contact voltage measurement devices

Non-contact current measurement system

Multi-sensor scanner configuration for non-contact voltage measurem...

Multi-sensor configuration for non-contact voltage measurement devices

Proving unit for non-contact voltage measurement systems

Non-contact electrical parameter measurement systems

Proving unit for voltage measurement systems

Magnetically coupled ground reference probe

Fluorescent lamp testing device

Patents Applicationslast 30 patents

NON-CONTACT VOLTAGE MEASUREMENT WITH ADJUSTABLE SIZE ROGOWSKI COIL

NON-CONTACT VOLTAGE MEASUREMENT WITH ADJUSTABLE SIZE ROGOWSKI COIL

SENSOR PROBE WITH CLAMP HAVING ADJUSTABLE INTERIOR REGION FOR NON-C...

NON-CONTACT DC VOLTAGE MEASUREMENT DEVICE WITH OSCILLATING SENSOR

NON-CONTACT CURRENT MEASUREMENT SYSTEM

MULTI-SENSOR CONFIGURATION FOR NON-CONTACT VOLTAGE MEASUREMENT DEVICES

POSITION DEPENDENT NON-CONTACT VOLTAGE AND CURRENT MEASUREMENT

MULTI-SENSOR SCANNER CONFIGURATION FOR NON-CONTACT VOLTAGE MEASUREM...

ADJUSTABLE LENGTH ROGOWSKI COIL MEASUREMENT DEVICE WITH NON-CONTACT...

NON-CONTACT DC VOLTAGE MEASUREMENT DEVICE WITH OSCILLATING SENSOR

NON-CONTACT CURRENT MEASUREMENT SYSTEM

PROVING UNIT FOR NON-CONTACT VOLTAGE MEASUREMENT SYSTEMS

PROVING UNIT FOR VOLTAGE MEASUREMENT SYSTEMS

NON-CONTACT ELECTRICAL PARAMETER MEASUREMENT SYSTEMS

SENSOR SUBSYSTEMS FOR NON-CONTACT VOLTAGE MEASUREMENT DEVICES

FLUORESCENT LAMP TESTING DEVICE