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Richard A. Larder
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Livermore, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Spring interconnect structures
Patent number
7,841,863
Issue date
Nov 30, 2010
FormFactor, Inc.
Gaetan L. Mathieu
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Probe card configuration for low mechanical flexural strength elect...
Patent number
7,825,674
Issue date
Nov 2, 2010
FormFactor, Inc.
Makarand S. Shinde
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for compensating thermally induced motion of prob...
Patent number
7,642,794
Issue date
Jan 5, 2010
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for compensating thermally induced motion of prob...
Patent number
7,560,941
Issue date
Jul 14, 2009
FormFactor, Inc.
Rod Martens
G01 - MEASURING TESTING
Information
Patent Grant
Spring interconnect structures
Patent number
7,553,165
Issue date
Jun 30, 2009
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Information
Patent Grant
Spring interconnect structures
Patent number
7,371,072
Issue date
May 13, 2008
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for compensating thermally induced motion of prob...
Patent number
7,312,618
Issue date
Dec 25, 2007
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for compensating thermally induced motion of prob...
Patent number
7,119,564
Issue date
Oct 10, 2006
FormFactor, Inc.
Rod Martens
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for compensating for thermally induced motion of...
Patent number
7,071,714
Issue date
Jul 4, 2006
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Grant
Probe card configuration for low mechanical flexural strength elect...
Patent number
7,071,715
Issue date
Jul 4, 2006
FormFactor, Inc.
Makarand S. Shinde
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for compensating thermally induced motion of prob...
Patent number
6,972,578
Issue date
Dec 6, 2005
FormFactor, Inc.
Rod Martens
G01 - MEASURING TESTING
Information
Patent Grant
Spring interconnect structures
Patent number
6,672,875
Issue date
Jan 6, 2004
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SPRING INTERCONNECT STRUCTURES
Publication number
20090263986
Publication date
Oct 22, 2009
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Information
Patent Application
SPRING INTERCONNECT STRUCTURES
Publication number
20080254651
Publication date
Oct 16, 2008
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Information
Patent Application
Method and System for Compensating Thermally Induced Motion of Prob...
Publication number
20080094088
Publication date
Apr 24, 2008
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR COMPENSATING THERMALLY INDUCED MOTION OF PROB...
Publication number
20070139060
Publication date
Jun 21, 2007
FormFactor, Inc.
Rod Martens
G01 - MEASURING TESTING
Information
Patent Application
Probe card configuration for low mechanical flexural strength elect...
Publication number
20060244470
Publication date
Nov 2, 2006
FormFactor, Inc.
Makarand S. Shinde
G01 - MEASURING TESTING
Information
Patent Application
Method And System For Compensating Thermally Induced Motion Of Prob...
Publication number
20060238211
Publication date
Oct 26, 2006
FormFactor, Inc.
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Application
Method and system for compensating thermally induced motion of prob...
Publication number
20060001440
Publication date
Jan 5, 2006
FormFactor, Inc.
Rod Martens
G01 - MEASURING TESTING
Information
Patent Application
Probe card configuration for low mechanical flexural strength elect...
Publication number
20050156611
Publication date
Jul 21, 2005
FormFactor, Inc.
Makarand S. Shinde
G01 - MEASURING TESTING
Information
Patent Application
Spring interconnect structures
Publication number
20040142583
Publication date
Jul 22, 2004
FormFactor, Inc.
Gaetan L. Mathieu
G01 - MEASURING TESTING
Information
Patent Application
Method and system for compensating thermally induced motion of prob...
Publication number
20030085721
Publication date
May 8, 2003
Benjamin N. Eldridge
G01 - MEASURING TESTING
Information
Patent Application
Method and system for compensating thermally induced motion of prob...
Publication number
20030085723
Publication date
May 8, 2003
Rod Martens
G01 - MEASURING TESTING