Richard A. Nygaard JR.

Person

Colorado Springs, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Composite eye diagrams
- Patent number 6,810,346
- Issue date Oct 26, 2004
- Agilent Technologies, Inc.
- Richard A Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Fast eye diagram analyzer uses nearest neighbor transverse to quick...
- Patent number 6,804,633
- Issue date Oct 12, 2004
- Agilent Technologies, Inc.
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Signal transition and stable regions diagram for positioning a logi...
- Patent number 6,799,127
- Issue date Sep 28, 2004
- Agilent Technologies, Inc.
- David N Sontag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for performing eye diagram measurements
- Patent number 6,785,622
- Issue date Aug 31, 2004
- Agilent Technologies, Inc.
- Richard A Nygaard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Eye diagram analyzer with fixed data channel delays and swept clock...
- Patent number 6,768,703
- Issue date Jul 27, 2004
- Agilent Technologies, Inc.
- Richard A Nygaard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
On-screen tools for eye diagram measurements
- Patent number 6,760,676
- Issue date Jul 6, 2004
- Agilent Technologies, Inc.
- Richard A Nygaard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Identification of channels and associated signal information contri...
- Patent number 6,668,235
- Issue date Dec 23, 2003
- Agilent Technologies, Inc.
- Richard A Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
System and method for specifying trigger conditions of a signal mea...
- Patent number 6,624,829
- Issue date Sep 23, 2003
- Agilent Technologies, Inc.
- Douglas James Beck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for comparing values from target systems
- Patent number 6,578,058
- Issue date Jun 10, 2003
- Agilent Technologies, Inc.
- Richard A. Nygaard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for adjusting a sampling time in a logic analyzer
- Patent number 6,463,392
- Issue date Oct 8, 2002
- Agilent Technologies, Inc.
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
System and method for comparing values during logic analysis
- Patent number 6,191,683
- Issue date Feb 20, 2001
- Agilent Technologies, Inc.
- Richard A. Nygaard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic selection of a special mode of operation in multi-channel...
- Patent number 6,131,175
- Issue date Oct 10, 2000
- Hewlett-Packard Co.
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Multiple probe test equipment with channel identification
- Patent number 6,052,807
- Issue date Apr 18, 2000
- Hewlett-Packard Company
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining if a digital value lies within...
- Patent number 4,633,410
- Issue date Dec 30, 1986
- Hewlett-Packard Company
- Richard A. Nygaard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining if a digital value lies within...
- Patent number 4,554,632
- Issue date Nov 19, 1985
- Hewlett-Packard Company
- Richard A. Nygaard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variable resolution counter
- Patent number 4,477,920
- Issue date Oct 16, 1984
- Hewlett-Packard Company
- Richard A. Nygaard
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Analog display of signal swing and logic analyzer thresholds
- Publication number 20070088529
- Publication date Apr 19, 2007
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
User interface for selection of sampling parameters in a logic anal...
- Publication number 20060256847
- Publication date Nov 16, 2006
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
Method for selecting optimum sampling parameters for a plurality of...
- Publication number 20060245528
- Publication date Nov 2, 2006
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
Method for normalization of an eye diagram and selection of samplin...
- Publication number 20060190200
- Publication date Aug 24, 2006
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
Method for selecting and extracting an eye diagram opening for subs...
- Publication number 20060188045
- Publication date Aug 24, 2006
- Richard A. Nygaard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Forced-alignment measurement tools for composite eye diagrams
- Publication number 20050100215
- Publication date May 12, 2005
- Richard A. Nygaard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Eye diagram analyzer correctly samples low dv/dt voltages
- Publication number 20050027467
- Publication date Feb 3, 2005
- David D. Eskeldson
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for performing eye diagram measurements
- Publication number 20040225460
- Publication date Nov 11, 2004
- Richard A. Nygaard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Fast eye diagram analyzer uses nearest neighbor traverse to quickly...
- Publication number 20040153266
- Publication date Aug 5, 2004
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
On-screen tools for eye diagram measurements
- Publication number 20040024547
- Publication date Feb 5, 2004
- Richard A. Nygaard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Eye diagram analyzer with fixed data channel delays and swept clock...
- Publication number 20030202427
- Publication date Oct 30, 2003
- Richard A. Nygaard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Expedited selection of items from a list within a drop down menu of...
- Publication number 20030193525
- Publication date Oct 16, 2003
- Richard A. Nygaard
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Identification of channels and associated signal information contri...
- Publication number 20030187620
- Publication date Oct 2, 2003
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
Composite eye diagrams
- Publication number 20030158687
- Publication date Aug 21, 2003
- Richard A. Nygaard
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for performing eye diagram measurements
- Publication number 20030083833
- Publication date May 1, 2003
- Richard A. Nygaard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Richard A. Nygaard JR.

Person

Patents Grantslast 30 patents

Composite eye diagrams

Fast eye diagram analyzer uses nearest neighbor transverse to quick...

Signal transition and stable regions diagram for positioning a logi...

Method and apparatus for performing eye diagram measurements

Eye diagram analyzer with fixed data channel delays and swept clock...

On-screen tools for eye diagram measurements

Identification of channels and associated signal information contri...

System and method for specifying trigger conditions of a signal mea...

System and method for comparing values from target systems

System and method for adjusting a sampling time in a logic analyzer

System and method for comparing values during logic analysis

Automatic selection of a special mode of operation in multi-channel...

Multiple probe test equipment with channel identification

Method and apparatus for determining if a digital value lies within...

Method and apparatus for determining if a digital value lies within...

Variable resolution counter

Patents Applicationslast 30 patents

Analog display of signal swing and logic analyzer thresholds

User interface for selection of sampling parameters in a logic anal...

Method for selecting optimum sampling parameters for a plurality of...

Method for normalization of an eye diagram and selection of samplin...

Method for selecting and extracting an eye diagram opening for subs...

Forced-alignment measurement tools for composite eye diagrams

Eye diagram analyzer correctly samples low dv/dt voltages

Method and apparatus for performing eye diagram measurements

Fast eye diagram analyzer uses nearest neighbor traverse to quickly...

On-screen tools for eye diagram measurements

Eye diagram analyzer with fixed data channel delays and swept clock...

Expedited selection of items from a list within a drop down menu of...

Identification of channels and associated signal information contri...

Composite eye diagrams

Method and apparatus for performing eye diagram measurements