Richard Alan PORTUNE

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe tip to device pad alignment in obscured view probing applicat...
- Patent number 8,159,243
- Issue date Apr 17, 2012
- DCG Systems, Inc.
- Richard Alan Portune
- G01 - MEASURING TESTING
Information Patent Grant
Undoped silicon heat spreader window
- Patent number 7,956,625
- Issue date Jun 7, 2011
- DCG Systems, Inc.
- Richard A. Portune
- G02 - OPTICS
Information Patent Grant
Apparatus and method for hard-docking a tester to a tiltable imager
- Patent number 7,480,051
- Issue date Jan 20, 2009
- DCG Systems, Inc.
- Jonathan Frank
- G01 - MEASURING TESTING
Information Patent Grant
Method for local wafer thinning and reinforcement
- Patent number 7,314,767
- Issue date Jan 1, 2008
- Credence Systems Corporation
- Richard A. Portune
- G01 - MEASURING TESTING
Information Patent Grant
High-speed, high-resolution, large area inspection using multiple o...
- Patent number 5,966,212
- Issue date Oct 12, 1999
- Pixel Systems, Inc.
- Lawrence Hendler
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
UNDOPED SILICON HEAT SPREADER WINDOW
- Publication number 20110201256
- Publication date Aug 18, 2011
- Richard A. PORTUNE
- G02 - OPTICS
Information Patent Application
PROBE TIP TO DEVICE PAD ALIGNMENT IN OBSCURED VIEW PROBING APPLICAT...
- Publication number 20100117672
- Publication date May 13, 2010
- DCG SYSTEMS, INC.
- Richard Alan PORTUNE
- G01 - MEASURING TESTING
Information Patent Application
Water bond-out
- Publication number 20070152696
- Publication date Jul 5, 2007
- Larry K. Ross
- G01 - MEASURING TESTING
Information Patent Application
Method for local wafer thinning and reinforcement
- Publication number 20060267009
- Publication date Nov 30, 2006
- CREDENCE SYSTEMS CORPORATION
- Richard A. Portune
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for hard-dock a tester to a tiltable imager
- Publication number 20060176477
- Publication date Aug 10, 2006
- Credence Systems, Inc.
- Jonathan Frank
- G01 - MEASURING TESTING