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Richard Alan YOST
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Gainesville, FL, US
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Patents Grants
last 30 patents
Information
Patent Grant
Atmospheric pressure ion guide
Patent number
11,469,089
Issue date
Oct 11, 2022
University of Florida Research Foundation, Incorporated
Jared J. Boock
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Atmospheric pressure ion guide
Patent number
10,607,826
Issue date
Mar 31, 2020
University of Florida Research Foundation, Incorporated
Jared J. Boock
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Partial ovoidal FAIMS electrode
Patent number
8,237,118
Issue date
Aug 7, 2012
University of Florida Research Foundation, Inc.
Todd Prox
G01 - MEASURING TESTING
Information
Patent Grant
Pneumatic ion beam focusing in high-field asymmetric waveform ion m...
Patent number
8,049,167
Issue date
Nov 1, 2011
University of Florida Research Foundation, Inc.
Leonard C. Rorrer, III
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for FAIMS with a laser-based ionization source
Patent number
7,135,674
Issue date
Nov 14, 2006
Thermo Finnigan LLC.
Roger Guevremont
G01 - MEASURING TESTING
Information
Patent Grant
Method for performing a scan function on quadrupole ion trap mass s...
Patent number
6,147,348
Issue date
Nov 14, 2000
University of Florida
Scott T. Quarmby
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for improved trapping efficiency of injected ions...
Patent number
5,747,801
Issue date
May 5, 1998
University of Florida
Scott T. Quarmby
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Quadrupole ion trap mass spectrometer having two axial modulation e...
Patent number
5,352,890
Issue date
Oct 4, 1994
University of Florida
Jodie V. Johnson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Quadrupole ion trap mass spectrometer having two axial modulation e...
Patent number
5,171,991
Issue date
Dec 15, 1992
Finnigan Corporation
Jodie V. Johnson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of operating an ion trap mass spectrometer to determine the...
Patent number
5,128,542
Issue date
Jul 7, 1992
Finnigan Corporation
Nathan A. Yates
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Direct resistive heating and temperature measurement of metal-clad...
Patent number
5,114,439
Issue date
May 19, 1992
University of Florida
Richard A. Yost
G01 - MEASURING TESTING
Information
Patent Grant
Quadrupole ion trap mass spectrometer having two pulsed axial excit...
Patent number
5,075,547
Issue date
Dec 24, 1991
Finnigan Corporation
Jodie V. Johnson
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
DEVICE AND METHOD FOR DETECTION OF CANNABIS AND OTHER CONTROLLED SU...
Publication number
20190307396
Publication date
Oct 10, 2019
CANNABIX TECHNOLOGIES INC.
Rajpaul ATTARIWALA
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
METHODS AND SYSTEMS FOR DETECTING MELANOMA
Publication number
20190033313
Publication date
Jan 31, 2019
University of Florida Research Foundation, Inc.
NIKOLAUS GRAVENSTEIN
G01 - MEASURING TESTING
Information
Patent Application
IROA METABOLOMICS WORKFLOW FOR IMPROVED ACCURACY, IDENTIFICATION AN...
Publication number
20180315587
Publication date
Nov 1, 2018
IROA Technogies, LLC
Christopher Beecher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ATMOSPHERIC PRESSURE ION GUIDE
Publication number
20180233342
Publication date
Aug 16, 2018
JARED J. BOOCK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS TAGS FOR MASS SPECTROMETRIC ANALYSIS OF IMMUNOGLOBULINS
Publication number
20120196297
Publication date
Aug 2, 2012
Richard A. Yost
G01 - MEASURING TESTING
Information
Patent Application
PNEUMATIC ION BEAM FOCUSING IN HIGH-FIELD ASYMMETRIC WAVEFORM ION M...
Publication number
20100264306
Publication date
Oct 21, 2010
University of Florida Research Foundation, Inc.
Leonard C. RORRER, III
G01 - MEASURING TESTING
Information
Patent Application
PARTIAL OVOIDAL FAIMS ELECTRODE
Publication number
20100044557
Publication date
Feb 25, 2010
Todd A. Prox
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for FAIMS with a laser-based ionization source
Publication number
20050161597
Publication date
Jul 28, 2005
Ionalytics Corporation
Roger Guevremont
G01 - MEASURING TESTING