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Richard Arinero
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Montpellier, FR
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last 30 patents
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Patent Grant
Measurement of radiations of high influence by a capacitive element...
Patent number
8,981,308
Issue date
Mar 17, 2015
Universite Montpellier 2 Sciences et Techniques
Richard Arinero
G01 - MEASURING TESTING
Information
Patent Grant
Higher harmonics atomic force microscope
Patent number
8,234,913
Issue date
Aug 7, 2012
Centre National de la Recherche Scientifique CNRS
Paul Girard
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
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Patent Application
MEASUREMENT OF RADIATIONS OF HIGH INFLUENCE BY A CAPACITIVE ELEMENT...
Publication number
20140034841
Publication date
Feb 6, 2014
UNIVERSITE MONTPELLIER 2 SCIENCES ET TECHNIQUES
Richard Arinero
G01 - MEASURING TESTING
Information
Patent Application
Higher Harmonics Atomic Force Microscope
Publication number
20080223120
Publication date
Sep 18, 2008
Paul Girard
G01 - MEASURING TESTING