Richard B. Haigh

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Buchanen, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Etching charge measurement system
- Patent number 4,689,132
- Issue date Aug 25, 1987
- Leco Corporation
- Richard B. Haigh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling an analytical furnace
- Patent number 4,404,461
- Issue date Sep 13, 1983
- Leco Corporation
- George J. Sitek
- F27 - FURNACES KILNS OVENS RETORTS