Richard C. Dokken

Person

San Ramon, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Process for improving design-limited yield by localizing potential...
- Patent number 8,615,691
- Issue date Dec 24, 2013
- Advantest (Singapore) Pte Ltd
- Richard C Dokken
- G01 - MEASURING TESTING
Information Patent Grant
Process for improving design limited yield by efficiently capturing...
- Patent number 8,453,026
- Issue date May 28, 2013
- Advantest (Singapore) Pte Ltd
- Gerald S. Chan
- G01 - MEASURING TESTING
Information Patent Grant
Method for operating a secure semiconductor IP server to support fa...
- Patent number 8,060,851
- Issue date Nov 15, 2011
- Verigy (Singapore) Pte. Ltd.
- Richard C. Dokken
- G01 - MEASURING TESTING
Information Patent Grant
Methods for analyzing scan chains, and for determining numbers or l...
- Patent number 8,010,856
- Issue date Aug 30, 2011
- Verigy (Singapore) Pte. Ltd.
- Stephen A. Cannon
- G01 - MEASURING TESTING
Information Patent Grant
System and method for device performance characterization in physic...
- Patent number 8,006,149
- Issue date Aug 23, 2011
- Verigy (Singapore) Pte. Ltd.
- Richard C. Dokken
- G01 - MEASURING TESTING
Information Patent Grant
Locating hold time violations in scan chains by generating patterns...
- Patent number 7,853,846
- Issue date Dec 14, 2010
- Verigy (Singapore) Pte. Ltd.
- Stephen A. Cannon
- G01 - MEASURING TESTING
Information Patent Grant
Process for identifying the location of a break in a scan chain in...
- Patent number 7,568,139
- Issue date Jul 28, 2009
- INOVYS Corporation
- Richard C Dokken
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for automatically determining a testing order whe...
- Patent number 7,047,463
- Issue date May 16, 2006
- INOVYS Corporation
- Donald V. Organ
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR OPERATING A SECURE SEMICONDUCTOR IP SERVER TO SUPPORT FA...
- Publication number 20100031092
- Publication date Feb 4, 2010
- Inovys Corporation
- RICHARD C. DOKKEN
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR ANALYZING SCAN CHAINS, AND FOR DETERMINING NUMBERS OR L...
- Publication number 20090113263
- Publication date Apr 30, 2009
- Stephen A. Cannon
- G01 - MEASURING TESTING
Information Patent Application
LOCATING HOLD TIME VIOLATIONS IN SCAN CHAINS BY GENERATING PATTERNS...
- Publication number 20090113265
- Publication date Apr 30, 2009
- Inovys Corporation
- Stephen A. Cannon
- G01 - MEASURING TESTING
Information Patent Application
PROCESS FOR IDENTIFYING THE LOCATION OF A BREAK IN A SCAN CHAIN IN...
- Publication number 20080141085
- Publication date Jun 12, 2008
- Inovys Corporation
- Richard C. Dokken
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Device Performance Characterization in Physic...
- Publication number 20080126896
- Publication date May 29, 2008
- Inovys Corporation
- Richard C. Dokken
- G01 - MEASURING TESTING
Information Patent Application
Process for improving design limited yield by efficiently capturing...
- Publication number 20080104468
- Publication date May 1, 2008
- Inovys Corporation
- GERALD S. CHAN
- G01 - MEASURING TESTING
Information Patent Application
PROCESS FOR IMPROVING DESIGN-LIMITED YIELD BY LOCALIZING POTENTIAL...
- Publication number 20080091981
- Publication date Apr 17, 2008
- Inovys Corporation
- RICHARD C. DOKKEN
- G01 - MEASURING TESTING

Richard C. Dokken

Person

Patents Grantslast 30 patents

Process for improving design-limited yield by localizing potential...

Process for improving design limited yield by efficiently capturing...

Method for operating a secure semiconductor IP server to support fa...

Methods for analyzing scan chains, and for determining numbers or l...

System and method for device performance characterization in physic...

Locating hold time violations in scan chains by generating patterns...

Process for identifying the location of a break in a scan chain in...

Method and system for automatically determining a testing order whe...

Patents Applicationslast 30 patents

METHOD FOR OPERATING A SECURE SEMICONDUCTOR IP SERVER TO SUPPORT FA...

METHODS FOR ANALYZING SCAN CHAINS, AND FOR DETERMINING NUMBERS OR L...

LOCATING HOLD TIME VIOLATIONS IN SCAN CHAINS BY GENERATING PATTERNS...

PROCESS FOR IDENTIFYING THE LOCATION OF A BREAK IN A SCAN CHAIN IN...

System and Method for Device Performance Characterization in Physic...

Process for improving design limited yield by efficiently capturing...

PROCESS FOR IMPROVING DESIGN-LIMITED YIELD BY LOCALIZING POTENTIAL...