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Richard Cooper
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Oxon, GB
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last 30 patents
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Patent Grant
In-situ crystalline material screening apparatus and method
Patent number
8,182,607
Issue date
May 22, 2012
Agilent Technologies, Inc.
Damian Kucharczyk
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
IN-SITU CRYSTALLINE MATERIAL SCREENING APPARATUS AND METHOD
Publication number
20070140421
Publication date
Jun 21, 2007
OXFORD DIFFRACTION LIMITED
Damian Kucharczyk
C30 - CRYSTAL GROWTH