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Two dimensional vernier
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Patent number 5,083,378
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Issue date Jan 28, 1992
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The United States of America as represented by the Administrator, National Ae...
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Richard D. Juday
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G01 - MEASURING TESTING
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Programmable remapper for image processing
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Patent number 5,067,019
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Issue date Nov 19, 1991
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The United States of America as represented by the administrator of the Natio...
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Richard D. Juday
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G06 - COMPUTING CALCULATING COUNTING
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Three dimensional moire pattern alignment
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Patent number 5,052,807
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Issue date Oct 1, 1991
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The United States of America as represented by the administrator of the Natio...
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Richard D. Juday
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G01 - MEASURING TESTING
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