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Richard D. Martin
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Newark, DE, US
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Patents Grants
last 30 patents
Information
Patent Grant
Slot coupled directional coupler and directional filters in multila...
Patent number
10,396,421
Issue date
Aug 27, 2019
Yifei Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Coherence switching
Patent number
9,297,702
Issue date
Mar 29, 2016
Phase Sensitive Innovations, Inc.
Richard D. Martin
G01 - MEASURING TESTING
Information
Patent Grant
Controlling the phase of optical carriers
Patent number
8,159,737
Issue date
Apr 17, 2012
Phase Sensitive Innovations, Inc.
Richard D. Martin
G01 - MEASURING TESTING
Information
Patent Grant
Method for controlling the phase of optical carriers in millimeter...
Patent number
7,965,435
Issue date
Jun 21, 2011
Phase Sensitive Innovations, Inc.
Christopher A. Schuetz
G01 - MEASURING TESTING
Information
Patent Grant
Silicon micromachined accelerometer/seismometer and method of makin...
Patent number
6,196,067
Issue date
Mar 6, 2001
California Institute of Technology
Richard D. Martin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SLOT COUPLED DIRECTIONAL COUPLER AND DIRECTIONAL FILTERS IN MULTILA...
Publication number
20180233796
Publication date
Aug 16, 2018
Yifei Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Coherence Switching
Publication number
20120288214
Publication date
Nov 15, 2012
Phase Sensitive Innovations, Inc
Richard D. Martin
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONTROLLING THE PHASE OF OPTICAL CARRIERS IN MILLIMETER...
Publication number
20110073772
Publication date
Mar 31, 2011
Phase Sensitive Innovations, Inc
Christopher A. Schuetz
G01 - MEASURING TESTING
Information
Patent Application
CONTROLLING THE PHASE OF OPTICAL CARRIERS
Publication number
20100271683
Publication date
Oct 28, 2010
Phase Sensitive Innovations, Inc
Christopher A. Schuetz
G01 - MEASURING TESTING
Information
Patent Application
Magnetic resonance coil modules
Publication number
20050073309
Publication date
Apr 7, 2005
Neil R. Williams
G01 - MEASURING TESTING