RICHARD DAVID JACOBS

Person

BROOKFIELD, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for determining a condition associated with a...
- Patent number 11,906,907
- Issue date Feb 20, 2024
- ASML Netherlands B.V.
- Derk Servatius Gertruda Brouns
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection apparatus, lithographic apparatus, and device manufactur...
- Patent number 9,285,687
- Issue date Mar 15, 2016
- ASML Holding N.V.
- Stanislav Y Smirnov
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Time differential reticle inspection
- Patent number 8,623,576
- Issue date Jan 7, 2014
- ASML Holding N.V.
- Eric Brian Catey
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle inspection systems and method
- Patent number 8,189,203
- Issue date May 29, 2012
- ASML Holding N.V.
- Yevgeniy Konstantinovich Shmarev
- G01 - MEASURING TESTING
Information Patent Grant
Laser initiated ordance system optical fiber continuity test
- Patent number 5,270,537
- Issue date Dec 14, 1993
- Santa Barbara Research Center
- Richard Jacobs
- F42 - AMMUNITION BLASTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...
- Publication number 20240103386
- Publication date Mar 28, 2024
- ASML NETHERLANDS B.V.
- Derk Servatius Gertruda BROUNS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...
- Publication number 20200341366
- Publication date Oct 29, 2020
- ASML NETHERLANDS B.V.
- Derk Servatius Gertruda BROUNS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection Apparatus, Lithographic Apparatus, and Device Manufactur...
- Publication number 20130083306
- Publication date Apr 4, 2013
- ASML Holding N.V.
- Stanislav Y. Smirnov
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Holographic Mask Inspection System with Spatial Filter
- Publication number 20120281197
- Publication date Nov 8, 2012
- ASML NETHERLANDS B.V.
- Robert Albert Tharaldsen
- G01 - MEASURING TESTING
Information Patent Application
Time Differential Reticle Inspection
- Publication number 20120171600
- Publication date Jul 5, 2012
- ASML Holding N.V.
- Eric Brian Catey
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Object Inspection Systems and Methods
- Publication number 20120081684
- Publication date Apr 5, 2012
- ASML NETHERLANDS B.V.
- Arie Jeffrey Den Oef
- G01 - MEASURING TESTING
Information Patent Application
Reticle Inspection Systems and Method
- Publication number 20100149548
- Publication date Jun 17, 2010
- ASML Holding N.V.
- YEVGENIY KONSTANTINOVICH SHMAREV
- G01 - MEASURING TESTING

RICHARD DAVID JACOBS

Person

Patents Grantslast 30 patents

Apparatus and method for determining a condition associated with a...

Inspection apparatus, lithographic apparatus, and device manufactur...

Time differential reticle inspection

Reticle inspection systems and method

Laser initiated ordance system optical fiber continuity test

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...

APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A...

Inspection Apparatus, Lithographic Apparatus, and Device Manufactur...

Holographic Mask Inspection System with Spatial Filter

Time Differential Reticle Inspection

Object Inspection Systems and Methods

Reticle Inspection Systems and Method