Richard E. Bornfreund

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and systems for coupling semiconductor substrates
- Patent number 10,971,540
- Issue date Apr 6, 2021
- FLIR Systems, Inc.
- Richard E. Bornfreund
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer level packaging of reduced-height infrared detectors
- Patent number 10,153,204
- Issue date Dec 11, 2018
- FLIR Systems, Inc.
- Tiahaar Kurtheru Clayton McKenzie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer-level back-end fabrication systems and methods
- Patent number 10,020,343
- Issue date Jul 10, 2018
- FLIR Systems, Inc.
- Edward K. Huang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Systems and methods for enhanced bolometer response
- Patent number 9,945,729
- Issue date Apr 17, 2018
- FLIR Systems, Inc.
- Robert F. Cannata
- G01 - MEASURING TESTING
Information Patent Grant
Deposition systems and methods
- Patent number 9,822,439
- Issue date Nov 21, 2017
- FLIR Systems, Inc.
- Tommy Marx
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Multilayered microbolometer film deposition
- Patent number 9,029,783
- Issue date May 12, 2015
- FLIR Systems, Inc.
- Robert F. Cannata
- G01 - MEASURING TESTING
Information Patent Grant
Aluminum indium antimonide focal plane array
- Patent number 8,552,480
- Issue date Oct 8, 2013
- FLIR Systems, Inc.
- Richard E. Bornfreund
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Aluminum indium antimonide focal plane array
- Patent number 8,552,479
- Issue date Oct 8, 2013
- FLIR Systems, Inc.
- Richard E. Bornfreund
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Microbolometer detector layer
- Patent number 8,502,147
- Issue date Aug 6, 2013
- FLIR Systems, Inc.
- Yaroslava Petraitis
- G01 - MEASURING TESTING
Information Patent Grant
Monolithic electro-optical polymer infrared focal plane array
- Patent number 8,471,204
- Issue date Jun 25, 2013
- FLIR Systems, Inc.
- Richard E. Bornfreund
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Alignment systems and methods
- Patent number 8,179,529
- Issue date May 15, 2012
- FLIR Systems, Inc.
- Ronald W. Berry
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE INTERCONNECTION SYSTEMS AND METHODS
- Publication number 20220115354
- Publication date Apr 14, 2022
- FLIR Commercial Systems, Inc.
- Richard E. BORNFREUND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER-LEVEL BACK-END FABRICATION SYSTEMS AND METHODS
- Publication number 20170207271
- Publication date Jul 20, 2017
- FLIR SYSTEMS, INC.
- Edward K. Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ENHANCED BOLOMETER RESPONSE
- Publication number 20170082497
- Publication date Mar 23, 2017
- FLIR SYSTEMS, INC.
- Robert F. Cannata
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEMS FOR COUPLING SEMICONDUCTOR SUBSTRATES
- Publication number 20170025453
- Publication date Jan 26, 2017
- FLIR SYSTEMS, INC.
- Richard E. Bornfreund
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL PACKAGING OF REDUCED-HEIGHT INFRARED DETECTORS
- Publication number 20150358558
- Publication date Dec 10, 2015
- FLIR SYSTEMS, INC.
- Tiahaar Kurtheru Clayton McKenzie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEPOSITION SYSTEMS AND METHODS
- Publication number 20150284838
- Publication date Oct 8, 2015
- FLIR SYSTEMS, INC.
- Tommy Marx
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
MICROBOLOMETER DETECTOR LAYER
- Publication number 20130082178
- Publication date Apr 4, 2013
- FLIR SYSTEMS, INC.
- Yaroslava Petraitis
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYERED MICROBOLOMETER FILM DEPOSITION
- Publication number 20120312992
- Publication date Dec 13, 2012
- FLIR SYSTEMS, INC.
- Robert F. Cannata
- G01 - MEASURING TESTING
Information Patent Application
MONOLITHIC ELECTRO-OPTICAL POLYMER INFRARED FOCAL PLANE ARRAY
- Publication number 20120161001
- Publication date Jun 28, 2012
- FLIR SYSTEMS, INC.
- Richard E. Bornfreund
- G01 - MEASURING TESTING
Information Patent Application
ALUMINUM INDIUM ANTIMONIDE FOCAL PLANE ARRAY
- Publication number 20110221024
- Publication date Sep 15, 2011
- FLIR SYSTEMS, INC.
- Richard E. Bornfreund
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
ALUMINUM INDIUM ANTIMONIDE FOCAL PLANE ARRAY
- Publication number 20110221025
- Publication date Sep 15, 2011
- FLIR SYSTEMS, INC.
- Richard E. Bornfreund
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Richard E. Bornfreund

Person

Patents Grantslast 30 patents

Method and systems for coupling semiconductor substrates

Wafer level packaging of reduced-height infrared detectors

Wafer-level back-end fabrication systems and methods

Systems and methods for enhanced bolometer response

Deposition systems and methods

Multilayered microbolometer film deposition

Aluminum indium antimonide focal plane array

Aluminum indium antimonide focal plane array

Microbolometer detector layer

Monolithic electro-optical polymer infrared focal plane array

Alignment systems and methods

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE INTERCONNECTION SYSTEMS AND METHODS

WAFER-LEVEL BACK-END FABRICATION SYSTEMS AND METHODS

SYSTEMS AND METHODS FOR ENHANCED BOLOMETER RESPONSE

METHOD AND SYSTEMS FOR COUPLING SEMICONDUCTOR SUBSTRATES

WAFER LEVEL PACKAGING OF REDUCED-HEIGHT INFRARED DETECTORS

DEPOSITION SYSTEMS AND METHODS

MICROBOLOMETER DETECTOR LAYER

MULTILAYERED MICROBOLOMETER FILM DEPOSITION

MONOLITHIC ELECTRO-OPTICAL POLYMER INFRARED FOCAL PLANE ARRAY

ALUMINUM INDIUM ANTIMONIDE FOCAL PLANE ARRAY

ALUMINUM INDIUM ANTIMONIDE FOCAL PLANE ARRAY