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Richard E. Stallcup II
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Little Elm, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Patterned atomic layer epitaxy
Patent number
7,799,132
Issue date
Sep 21, 2010
Zyvex Labs, LLC
John N. Randall
C30 - CRYSTAL GROWTH
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Patent Grant
Nano-manipulation by gyration
Patent number
6,812,460
Issue date
Nov 2, 2004
Zyvex Corporation
Richard E. Stallcup
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE PROBE OPERATION
Publication number
20080150557
Publication date
Jun 26, 2008
ZYVEX INSTRUMENTS, LLC
Christof BAUR
G01 - MEASURING TESTING
Information
Patent Application
PATTERNED ATOMIC LAYER EPITAXY
Publication number
20080092803
Publication date
Apr 24, 2008
ZYVEX LABS, LLC
John N. Randall
C30 - CRYSTAL GROWTH
Information
Patent Application
Charged particle beam device probe operation
Publication number
20060192116
Publication date
Aug 31, 2006
Zyvex Corporation
Christof Baur
G01 - MEASURING TESTING
Information
Patent Application
Patterned atomic layer epitaxy
Publication number
20050223968
Publication date
Oct 13, 2005
Zyvex Corporation
John N. Randall
C30 - CRYSTAL GROWTH
Information
Patent Application
Probe tip processing
Publication number
20050184028
Publication date
Aug 25, 2005
Zyvex Corporation
Christof Baur
G01 - MEASURING TESTING
Information
Patent Application
Probe current imaging
Publication number
20050184236
Publication date
Aug 25, 2005
Zyvex Corporation
Christof Baur
G01 - MEASURING TESTING
Information
Patent Application
System and method for picking and placing of nanoscale objects util...
Publication number
20050077468
Publication date
Apr 14, 2005
Zyvex Corporation
Christof Baur
B82 - NANO-TECHNOLOGY