Richard E. Stallcup, II

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Little Elm, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device probe operation
- Patent number 7,675,300
- Issue date Mar 9, 2010
- Zyvex Instruments, LLC
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Patterned atomic layer epitaxy
- Patent number 7,326,293
- Issue date Feb 5, 2008
- Zyvex Labs, LLC
- John N. Randall
- C30 - CRYSTAL GROWTH
Information Patent Grant
Charged particle beam device probe operation
- Patent number 7,319,336
- Issue date Jan 15, 2008
- Zyvex Instruments, LLC
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Probe current imaging
- Patent number 7,285,778
- Issue date Oct 23, 2007
- Zyvex Corporation
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Systems and method for picking and placing of nanoscale objects uti...
- Patent number 6,987,277
- Issue date Jan 17, 2006
- Zyvex Corporation
- Christof Baur
- B82 - NANO-TECHNOLOGY