Richard Earl Bills

Person

Tucson, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 10,018,572
- Issue date Jul 10, 2018
- KLA-Tencor Corporation
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,528,942
- Issue date Dec 27, 2016
- KLA-Tencor Corporation
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scattered light measurement system
- Patent number 9,518,930
- Issue date Dec 13, 2016
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,488,591
- Issue date Nov 8, 2016
- Uster Technologies AG
- Richard E. Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Front quartersphere scattered light analysis
- Patent number 9,110,033
- Issue date Aug 18, 2015
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Grant
System with multiple scattered light collectors
- Patent number 9,103,800
- Issue date Aug 11, 2015
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Grant
Back quartersphere scattered light analysis
- Patent number 8,553,215
- Issue date Oct 8, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a workpiece using scattered light
- Patent number 8,537,350
- Issue date Sep 17, 2013
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspection of a workpiece surface using multi...
- Patent number 8,497,984
- Issue date Jul 30, 2013
- KLA-Tencor Corporation
- Richard Earl Bills
- G01 - MEASURING TESTING
Information Patent Grant
Back quartersphere scattered light analysis
- Patent number 8,330,947
- Issue date Dec 11, 2012
- KLA-Tencor Corporation
- Richard Earl Bills
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting a workpiece using polarization of scattered light
- Patent number 8,059,268
- Issue date Nov 15, 2011
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Grant
System and method for controlling a beam source in a workpiece surf...
- Patent number 7,839,495
- Issue date Nov 23, 2010
- KLA-Tencor Corporation
- Bruce Baran
- G01 - MEASURING TESTING
Information Patent Grant
System and method for controlling light scattered from a workpiece...
- Patent number 7,659,974
- Issue date Feb 9, 2010
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspecting a workpiece surface using polariza...
- Patent number 7,623,227
- Issue date Nov 24, 2009
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for inspecting a workpiece surface by analyzing s...
- Patent number 7,605,913
- Issue date Oct 20, 2009
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for controlling a beam source in a workpiece surf...
- Patent number 7,557,910
- Issue date Jul 7, 2009
- KLA-Tencor Corporation
- Bruce Baran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for controlling light scattered from a workpiece...
- Patent number 7,417,722
- Issue date Aug 26, 2008
- KLA-Tencor Technologies Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for detecting defects in the surface of a work...
- Patent number 6,529,270
- Issue date Mar 4, 2003
- ADE Optical Systems Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Front Quartersphere Scattered Light Analysis
- Publication number 20170010222
- Publication date Jan 12, 2017
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Application
Front Quartersphere Scattered Light Analysis
- Publication number 20150042993
- Publication date Feb 12, 2015
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Application
Front Quartersphere Scattered Light Analysis
- Publication number 20150042987
- Publication date Feb 12, 2015
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEFECT INSPECTION SYSTEM
- Publication number 20140268105
- Publication date Sep 18, 2014
- Zygo Corporation
- Richard Earl Bills
- G02 - OPTICS
Information Patent Application
System With Polarized Scattered Light
- Publication number 20130342833
- Publication date Dec 26, 2013
- KLA-Tencor Corporation
- Neil Judell
- G01 - MEASURING TESTING
Information Patent Application
System With Multiple Scattered Light Collectors
- Publication number 20130335733
- Publication date Dec 19, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Application
Back Quartersphere Scattered Light Analysis
- Publication number 20130094023
- Publication date Apr 18, 2013
- KLA-Tencor Corporation
- Richard E. Bills
- G01 - MEASURING TESTING
Information Patent Application
Inspecting a Workpiece Using Polarization of Scattered Light
- Publication number 20120013898
- Publication date Jan 19, 2012
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Back Quartersphere Scattered Light Analysis
- Publication number 20100265518
- Publication date Oct 21, 2010
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Controlling a Beam Source in a Workpiece Surf...
- Publication number 20100149527
- Publication date Jun 17, 2010
- KLA-Tencor Corporation
- Bruce Baran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Front Quartersphere Scattered Light Analysis
- Publication number 20100110419
- Publication date May 6, 2010
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspecting a Workpiece Using Polarization of Scattered Light
- Publication number 20100110420
- Publication date May 6, 2010
- KLA-Tencor Corporation
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING LIGHT SCATTERED FROM A WORKPIECE...
- Publication number 20080304057
- Publication date Dec 11, 2008
- KLA-Tencor Corporation
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for controlling a beam source in a workpiece surf...
- Publication number 20070252977
- Publication date Nov 1, 2007
- Bruce Baran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a workpiece surface by analyzing s...
- Publication number 20070024998
- Publication date Feb 1, 2007
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspection of a workpiece surface using multi...
- Publication number 20060256326
- Publication date Nov 16, 2006
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a workpiece surface using polariza...
- Publication number 20060192948
- Publication date Aug 31, 2006
- Neil Judell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for inspecting a workpiece surface by analyzing s...
- Publication number 20060192949
- Publication date Aug 31, 2006
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for controlling light scattered from a workpiece...
- Publication number 20060186362
- Publication date Aug 24, 2006
- Richard Earl Bills
- G06 - COMPUTING CALCULATING COUNTING

Richard Earl Bills

Person

Patents Grantslast 30 patents

Front quartersphere scattered light analysis

Front quartersphere scattered light analysis

Scattered light measurement system

Front quartersphere scattered light analysis

Front quartersphere scattered light analysis

System with multiple scattered light collectors

Back quartersphere scattered light analysis

Inspecting a workpiece using scattered light

System and method for inspection of a workpiece surface using multi...

Back quartersphere scattered light analysis

Inspecting a workpiece using polarization of scattered light

System and method for controlling a beam source in a workpiece surf...

System and method for controlling light scattered from a workpiece...

System and method for inspecting a workpiece surface using polariza...

System and method for inspecting a workpiece surface by analyzing s...

System and method for controlling a beam source in a workpiece surf...

System and method for controlling light scattered from a workpiece...

Apparatus and method for detecting defects in the surface of a work...

Patents Applicationslast 30 patents

Front Quartersphere Scattered Light Analysis

Front Quartersphere Scattered Light Analysis

Front Quartersphere Scattered Light Analysis

OPTICAL DEFECT INSPECTION SYSTEM

System With Polarized Scattered Light

System With Multiple Scattered Light Collectors

Back Quartersphere Scattered Light Analysis

Inspecting a Workpiece Using Polarization of Scattered Light

Back Quartersphere Scattered Light Analysis

System and Method for Controlling a Beam Source in a Workpiece Surf...

Front Quartersphere Scattered Light Analysis

Inspecting a Workpiece Using Polarization of Scattered Light

SYSTEM AND METHOD FOR CONTROLLING LIGHT SCATTERED FROM A WORKPIECE...

System and method for controlling a beam source in a workpiece surf...

System and method for inspecting a workpiece surface by analyzing s...

System and method for inspection of a workpiece surface using multi...

System and method for inspecting a workpiece surface using polariza...

System and method for inspecting a workpiece surface by analyzing s...

System and method for controlling light scattered from a workpiece...