TREA

Richard Graetz

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  • Mountain View, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    All surface film metrology system
    • Patent number 10,563,973
    • Issue date Feb 18, 2020
    • KLA-Tencor Corporation
    • Shifang Li
    • G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ALL SURFACE FILM METROLOGY SYSTEM
    • Publication number 20170278236
    • Publication date Sep 28, 2017
    • KLA-Tencor Corporation
    • Shifang Li
    • G01 - MEASURING TESTING