Richard J. Huard

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Combination low capacitance probe tip and socket for a measurement...
- Patent number 6,552,523
- Issue date Apr 22, 2003
- Tektronix, Inc.
- Richard J. Huard
- G01 - MEASURING TESTING
Information Patent Grant
Adapter for a measurement test probe
- Patent number 6,191,594
- Issue date Feb 20, 2001
- Tektronix, Inc.
- Mark W. Nightingale
- G01 - MEASURING TESTING
Information Patent Grant
Dual path attenuator for a high frequency calibration circuit
- Patent number 5,920,187
- Issue date Jul 6, 1999
- Tektronix, Inc.
- Kevin E. Cosgrove
- G01 - MEASURING TESTING
Information Patent Grant
High frequency calibration circuit
- Patent number 5,621,310
- Issue date Apr 15, 1997
- Tektronix, Inc.
- Kevin E. Cosgrove
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Combination low capacitance probe tip and socket for a measurement...
- Publication number 20020175667
- Publication date Nov 28, 2002
- Richard J. Huard
- G01 - MEASURING TESTING