Richard J. Joyce

Person

Thousand Oaks, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
High stability angular sensor
- Patent number 11,506,493
- Issue date Nov 22, 2022
- HRL Laboratories, LLC
- Logan D. Sorenson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Dual magnetic and electric field quartz sensor
- Patent number 10,921,360
- Issue date Feb 16, 2021
- HRL Laboratories, LLC
- Randall L. Kubena
- G01 - MEASURING TESTING
Information Patent Grant
High dynamic range gyroscope
- Patent number 10,914,585
- Issue date Feb 9, 2021
- HRL Laboratories, LLC
- Logan D. Sorenson
- G01 - MEASURING TESTING
Information Patent Grant
High dynamic range gyroscope
- Patent number 10,697,772
- Issue date Jun 30, 2020
- HRL Laboratories, LLC
- Logan D. Sorenson
- G01 - MEASURING TESTING
Information Patent Grant
High stability angular sensor
- Patent number 10,571,267
- Issue date Feb 25, 2020
- HRL Laboratories, LLC
- Logan D. Sorenson
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Gyromagnetic geopositioning system
- Patent number 10,514,261
- Issue date Dec 24, 2019
- HRL Laboratories, LLC
- Logan D. Sorenson
- G01 - MEASURING TESTING
Information Patent Grant
High dynamic range gyroscope
- Patent number 10,444,014
- Issue date Oct 15, 2019
- HRL Laboratories, LLC
- Logan D. Sorenson
- G01 - MEASURING TESTING
Information Patent Grant
Gyroscope frequency tuning tabs on support spokes
- Patent number 10,422,641
- Issue date Sep 24, 2019
- HRL Laboratories, LLC
- Raviv Perahia
- G01 - MEASURING TESTING
Information Patent Grant
ALD metal coatings for high Q MEMS structures
- Patent number 10,266,398
- Issue date Apr 23, 2019
- HRL Laboratories, LLC
- Randall L. Kubena
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Gradient force disk resonating gyroscope
- Patent number 10,240,925
- Issue date Mar 26, 2019
- HRL Laboratories, LLC
- Raviv Perahia
- G01 - MEASURING TESTING
Information Patent Grant
Micro-scale piezoelectric resonating magnetometer
- Patent number 9,977,097
- Issue date May 22, 2018
- HRL Laboratories, LLC
- Hung Nguyen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated laser vibrometer MEMS micro-shell gyroscope
- Patent number 9,557,173
- Issue date Jan 31, 2017
- HRL Laboratories, LLC
- Raviv Perahia
- G01 - MEASURING TESTING
Information Patent Grant
MEMS device connected to a substrate by flexible support structures
- Patent number 9,334,153
- Issue date May 10, 2016
- HRL Laboratories, LLC
- Raviv Perahia
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Phase noise reduction control loop for oscillators using nonlinear...
- Patent number 8,994,465
- Issue date Mar 31, 2015
- HRL Laboratories, LLC
- Randall L. Kubena
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Gyroscope packaging assembly
- Patent number 8,418,554
- Issue date Apr 16, 2013
- The Boeing Company
- Richard J. Joyce
- G01 - MEASURING TESTING
Information Patent Grant
Method to locate and eliminate manufacturing defects in a quartz re...
- Patent number 8,144,317
- Issue date Mar 27, 2012
- HRL Laboratories, LLC
- Richard J. Joyce
- G01 - MEASURING TESTING
Information Patent Grant
Method to locate and eliminate manufacturing defects in a quartz re...
- Patent number 7,972,552
- Issue date Jul 5, 2011
- HRL Laboratories, LLC
- Richard J. Joyce
- G01 - MEASURING TESTING
Information Patent Grant
Micro electrical mechanical system (MEMS) tuning using focused ion...
- Patent number 7,282,834
- Issue date Oct 16, 2007
- HRL Laboratories, LLC
- Randall L. Kubena
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Micro electrical mechanical system (MEMS) tuning using focused ion...
- Patent number 6,922,118
- Issue date Jul 26, 2005
- HRL Laboratories, LLC
- Randall L. Kubena
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Microgyro tuning using focused ion beams
- Patent number 6,698,287
- Issue date Mar 2, 2004
- The Boeing Company
- Randall L. Kubena
- G01 - MEASURING TESTING
Information Patent Grant
Method of in-situ displacement/stress control in electroplating
- Patent number 6,238,539
- Issue date May 29, 2001
- Hughes Electronics Corporation
- Richard J. Joyce
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Method to detect penetration of a surface and apparatus implementin...
- Patent number 5,568,124
- Issue date Oct 22, 1996
- Hughes Aircraft Company
- Richard J. Joyce
- G08 - SIGNALLING
Information Patent Grant
Direct measurement of photodiode impedance using electron beam probing
- Patent number 4,885,534
- Issue date Dec 5, 1989
- Santa Barbara Research Center
- Robert E. Eck
- G01 - MEASURING TESTING
Information Patent Grant
Electron-beam probing of photodiodes
- Patent number 4,730,158
- Issue date Mar 8, 1988
- Santa Barbara Research Center
- Ichiro Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Voltage calibration in E-beam probe using optical flooding
- Patent number 4,695,794
- Issue date Sep 22, 1987
- Santa Barbara Research Center
- Charley B. Bargett
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Dual Magnetic and Electric Field Quartz Sensor
- Publication number 20190250198
- Publication date Aug 15, 2019
- HRL LABORATORIES, LLC
- Randall L. Kubena
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
GYROMAGNETIC GEOPOSITIONING SYSTEM
- Publication number 20170292840
- Publication date Oct 12, 2017
- HRL LABORATORIES, LLC
- Logan D. Sorenson
- G01 - MEASURING TESTING
Information Patent Application
GYROSCOPE PACKAGING ASSEMBLY
- Publication number 20100300202
- Publication date Dec 2, 2010
- Richard J. Joyce
- G01 - MEASURING TESTING
Information Patent Application
Micro electrical mechanical system (MEMS) tuning using focused ion...
- Publication number 20050269901
- Publication date Dec 8, 2005
- HRL Laboratories, LLC
- Randall L. Kubena
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Micro electrical mechanical system (MEMS) tuning using focused ion...
- Publication number 20040085159
- Publication date May 6, 2004
- Randall L. Kubena
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Microgyro tuning using focused ion beams
- Publication number 20030101792
- Publication date Jun 5, 2003
- Randall L. Kubena
- G01 - MEASURING TESTING

Richard J. Joyce

Person

Patents Grantslast 30 patents

High stability angular sensor

Dual magnetic and electric field quartz sensor

High dynamic range gyroscope

High dynamic range gyroscope

High stability angular sensor

Gyromagnetic geopositioning system

High dynamic range gyroscope

Gyroscope frequency tuning tabs on support spokes

ALD metal coatings for high Q MEMS structures

Gradient force disk resonating gyroscope

Micro-scale piezoelectric resonating magnetometer

Integrated laser vibrometer MEMS micro-shell gyroscope

MEMS device connected to a substrate by flexible support structures

Phase noise reduction control loop for oscillators using nonlinear...

Gyroscope packaging assembly

Method to locate and eliminate manufacturing defects in a quartz re...

Method to locate and eliminate manufacturing defects in a quartz re...

Micro electrical mechanical system (MEMS) tuning using focused ion...

Micro electrical mechanical system (MEMS) tuning using focused ion...

Microgyro tuning using focused ion beams

Method of in-situ displacement/stress control in electroplating

Method to detect penetration of a surface and apparatus implementin...

Direct measurement of photodiode impedance using electron beam probing

Electron-beam probing of photodiodes

Voltage calibration in E-beam probe using optical flooding

Patents Applicationslast 30 patents

Dual Magnetic and Electric Field Quartz Sensor

GYROMAGNETIC GEOPOSITIONING SYSTEM

GYROSCOPE PACKAGING ASSEMBLY

Micro electrical mechanical system (MEMS) tuning using focused ion...

Micro electrical mechanical system (MEMS) tuning using focused ion...

Microgyro tuning using focused ion beams