Richard J. Tansey

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Thousand Oaks, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Diffraction encoded position measuring apparatus
- Patent number 5,050,993
- Issue date Sep 24, 1991
- Rockwell International Corporation
- Richard J. Tansey
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for the recording and readout of multiple expo...
- Patent number 4,707,135
- Issue date Nov 17, 1987
- Rockwell International Corporation
- David M. Swain
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Phase-measuring interferometer
- Patent number 4,575,247
- Issue date Mar 11, 1986
- Rockwell International Corporation
- Richard J. Tansey
- G01 - MEASURING TESTING