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Richard Jacob Wilcox
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Austin, TX, US
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last 30 patents
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Patent Grant
Method and apparatus for capturing the internal state of a processo...
Patent number
7,290,188
Issue date
Oct 30, 2007
Advanced Micro Devices, Inc.
Spencer A. Peterson
G01 - MEASURING TESTING
Information
Patent Grant
Laser beam induced phenomena detection
Patent number
6,897,664
Issue date
May 24, 2005
Advanced Micro Devices, Inc.
Michael Bruce
G01 - MEASURING TESTING
Information
Patent Grant
Test fixture having an adjustable capacitance and method for testin...
Patent number
6,771,089
Issue date
Aug 3, 2004
Advanced Micro Devices, Inc.
Richard Jacob Wilcox
G01 - MEASURING TESTING
Information
Patent Grant
Data processing device test apparatus and method therefor
Patent number
6,546,513
Issue date
Apr 8, 2003
Advanced Micro Devices
Richard Jacob Wilcox
G06 - COMPUTING CALCULATING COUNTING