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Richard K. DeFreez
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Hillsboro, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Twin-spot light absorbing particulate monitoring instrument
Patent number
10,365,199
Issue date
Jul 30, 2019
Met One Instruments, Inc.
Richard K. DeFreez
G01 - MEASURING TESTING
Information
Patent Grant
Nephelometer with concentration-modulated sample flow
Patent number
8,284,398
Issue date
Oct 9, 2012
Met One Instruments, Inc.
Richard K. DeFreez
G01 - MEASURING TESTING
Information
Patent Grant
Integrated assembly for delivery of air stream for optical analysis
Patent number
7,659,523
Issue date
Feb 9, 2010
Hach Ultra Analytics, Inc.
Bret R. Warrick
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection system implemented with an immersed optical system
Patent number
7,355,706
Issue date
Apr 8, 2008
Hach Ultra Analytics, Inc.
Kenneth L. Girvin
G01 - MEASURING TESTING
Information
Patent Grant
Integrated assembly for delivery of air stream for optical analysis
Patent number
7,173,257
Issue date
Feb 6, 2007
Hach Ultra Analytics, Inc.
Bret R. Warrick
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection system implemented with a mirrored optical system
Patent number
6,784,990
Issue date
Aug 31, 2004
Pacific Scientific Instruments Company
Richard K. DeFreez
G01 - MEASURING TESTING
Information
Patent Grant
High sensitivity optical fluid-borne particle detection
Patent number
6,137,572
Issue date
Oct 24, 2000
Pacific Scientific Instruments Company
Richard K. DeFreez
G01 - MEASURING TESTING
Information
Patent Grant
Flow apertured intracavity laser particle detector
Patent number
6,111,642
Issue date
Aug 29, 2000
Pacific Scientific Instruments Company
Richard K. DeFreez
G01 - MEASURING TESTING
Information
Patent Grant
Dual detector array with noise cancellation for a particle size det...
Patent number
6,061,132
Issue date
May 9, 2000
Pacific Scientific Instruments Company
Kenneth L. Girvin
G01 - MEASURING TESTING
Information
Patent Grant
Particles counting apparatus and method having improved particle si...
Patent number
6,016,194
Issue date
Jan 18, 2000
Pacific Scientific Instruments Company
Kenneth L. Girvin
G01 - MEASURING TESTING
Information
Patent Grant
Particle detection system and method employing an upconversion laser
Patent number
5,946,093
Issue date
Aug 31, 1999
Met One, Inc.
Richard K. DeFreez
G01 - MEASURING TESTING
Information
Patent Grant
Dual laser heterodyne optical particle detection technique
Patent number
5,946,092
Issue date
Aug 31, 1999
Pacific Scientific Instruments Company
Richard K. DeFreez
G01 - MEASURING TESTING
Information
Patent Grant
Particle counter employing a chromium based solid-state laser with...
Patent number
5,903,347
Issue date
May 11, 1999
Met One, Inc.
Kenneth L. Girvin
G01 - MEASURING TESTING
Information
Patent Grant
Method for counting particles in a fluent stream
Patent number
5,864,399
Issue date
Jan 26, 1999
Met One, Inc.
Kenneth L. Girvin
G01 - MEASURING TESTING
Information
Patent Grant
Particle counter employing a solid-state laser with an intracavity...
Patent number
5,642,193
Issue date
Jun 24, 1997
Met One, Inc.
Kenneth L. Girvin
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for generating and employing a high density of...
Patent number
5,590,141
Issue date
Dec 31, 1996
Electro Scientific Industries, Inc.
Brian Baird
G02 - OPTICS
Information
Patent Grant
Optical frequency-converting medium pumped by unstable resonator se...
Patent number
5,559,824
Issue date
Sep 24, 1996
Electro Scientific Industries, Inc.
Brian Baird
G02 - OPTICS
Information
Patent Grant
Laser system and method employing a nonimaging concentrator
Patent number
5,323,414
Issue date
Jun 21, 1994
Electro Scientific Industries, Inc.
Brian Baird
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-power, compact, diode-pumped, tunable laser
Patent number
5,317,447
Issue date
May 31, 1994
Electro Scientific Industries, Inc.
Brian Baird
G02 - OPTICS
Information
Patent Grant
Method and apparatus for efficient operationof a solid-state laser...
Patent number
5,260,963
Issue date
Nov 9, 1993
Electro Scientific Industries, Inc.
Brian Baird
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Longitudinally coupled surface emitting semiconductor laser array
Patent number
4,797,892
Issue date
Jan 10, 1989
Oregon Graduate Center
Richard K. DeFreez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Two-dimensional phase-locked surface emitting semiconductor laser a...
Patent number
4,796,269
Issue date
Jan 3, 1989
Oregon Graduate Center
Richard K. DeFreez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focused ion beam micromachining of optical surfaces in materials
Patent number
4,698,129
Issue date
Oct 6, 1987
Oregon Graduate Center
Joseph Puretz
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
TWIN-SPOT LIGHT ABSORBING PARTICULATE MONITORING INSTRUMENT
Publication number
20190033194
Publication date
Jan 31, 2019
MET ONE INSTRUMENTS, INC.
Richard K. DeFreez
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR THE OPTICAL DETECTION OF AEROSOLS
Publication number
20110314937
Publication date
Dec 29, 2011
MesoSystems Technology, Inc.
Robert Johnson
G01 - MEASURING TESTING
Information
Patent Application
NEPHELOMETER WITH CONCENTRATION-MODULATED SAMPLE FLOW
Publication number
20110317162
Publication date
Dec 29, 2011
MET ONE INSTRUMENTS, INC.
Richard K. DeFreez
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR OPTICAL DETECTION OF AEROSOLS
Publication number
20090293646
Publication date
Dec 3, 2009
Robert Johnson
G01 - MEASURING TESTING
Information
Patent Application
Particle detection system implemented with an immersed optical system
Publication number
20060132770
Publication date
Jun 22, 2006
Hach Ultra Analytics, Inc.
Kenneth L. Girvin
G01 - MEASURING TESTING
Information
Patent Application
Particle detection system
Publication number
20050024641
Publication date
Feb 3, 2005
Richard K. DeFreez
G01 - MEASURING TESTING