Richard K. Workman

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for implementing augmented reality (AR)-based ass...
- Patent number 11,847,751
- Issue date Dec 19, 2023
- Agilent Technologies, Inc.
- Amir Ben-Dor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for implementing augmented reality (AR)-based ass...
- Patent number 11,494,988
- Issue date Nov 8, 2022
- Agilent Technologies, Inc.
- Amir Ben-Dor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for facilitating manual sorting of slides
- Patent number 10,217,011
- Issue date Feb 26, 2019
- Agilent Technologies, Inc.
- Richard K. Workman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Atomic force microscope system using selective active damping
- Patent number 8,769,710
- Issue date Jul 1, 2014
- Agilent Technologies, Inc.
- Christopher Ryan Moon
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip assembly for scanning probe microscopes
- Patent number 8,136,389
- Issue date Mar 20, 2012
- Agilent Technologies, Inc.
- Richard Paul Tella
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Automatic generation of PID parameters for a scanning probe microscope
- Patent number 7,987,006
- Issue date Jul 26, 2011
- Agilent Technologies, Inc.
- Daniel Y Abramovitch
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System for scanning probe microscope input device
- Patent number 7,659,509
- Issue date Feb 9, 2010
- Agilent Technologies, Inc.
- Richard K. Workman
- G01 - MEASURING TESTING
Information Patent Grant
Resonance method for determining the spring constant of scanning pr...
- Patent number 7,421,899
- Issue date Sep 9, 2008
- Agilent Technologies, Inc.
- Richard K. Workman
- G01 - MEASURING TESTING
Information Patent Grant
Force method for determining the spring constant of scanning probe...
- Patent number 7,395,697
- Issue date Jul 8, 2008
- Agilent Technologies, Inc.
- Richard K. Workman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR IMPLEMENTING AUGMENTED REALITY (AR)-BASED ASS...
- Publication number 20220351475
- Publication date Nov 3, 2022
- Agilent Technologies, Inc.
- Amir Ben-Dor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Implementing Augmented Reality (AR)-Based Ass...
- Publication number 20190362556
- Publication date Nov 28, 2019
- Agilent Technologies, Inc.
- Amir Ben-Dor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR TRANSFERRING A TISSUE SECTION
- Publication number 20190195748
- Publication date Jun 27, 2019
- Agilent Technologies, Inc.
- Victor Lim
- G01 - MEASURING TESTING
Information Patent Application
AUGMENTED REALITY SLIDE SORTER
- Publication number 20170301105
- Publication date Oct 19, 2017
- Agilent Technologies, Inc.
- Richard K. Workman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ATOMIC FORCE MICROSCOPE SYSTEM USING SELECTIVE ACTIVE DAMPING
- Publication number 20140137300
- Publication date May 15, 2014
- AGILENT TECHNOLOGIES, INC.
- Christopher Ryan Moon
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Probe Microscope that Outputs Metadata with Image
- Publication number 20100269232
- Publication date Oct 21, 2010
- Richard Kenton Workman
- G01 - MEASURING TESTING
Information Patent Application
Time-Tagged Data for Atomic Force Microscopy
- Publication number 20090139313
- Publication date Jun 4, 2009
- David Patrick Fromm
- G01 - MEASURING TESTING
Information Patent Application
PROBE TIP ASSEMBLY FOR SCANNING PROBE MICROSCOPES
- Publication number 20090107266
- Publication date Apr 30, 2009
- Richard Paul Tella
- G01 - MEASURING TESTING
Information Patent Application
System and methods for data sample decimation and display of scanni...
- Publication number 20090112957
- Publication date Apr 30, 2009
- Daniel Yves Abramovitch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic Generation Of PID Parameters For An Atomic Force Microscope
- Publication number 20090062935
- Publication date Mar 5, 2009
- Daniel Y. Abramovitch
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR SCANNING PROBE MICROSCOPE INPUT DEVICE
- Publication number 20080142708
- Publication date Jun 19, 2008
- Richard K. Workman
- G01 - MEASURING TESTING
Information Patent Application
Force method for Determining the Spring Constant of Scanning Probe...
- Publication number 20080011044
- Publication date Jan 17, 2008
- Richard K. Workman
- G01 - MEASURING TESTING
Information Patent Application
Resonance Method for Determining the Spring Constant of Scanning Pr...
- Publication number 20080011083
- Publication date Jan 17, 2008
- Richard K. Workman
- G01 - MEASURING TESTING
Information Patent Application
Displacement Method for Determining the Spring Constant of Scanning...
- Publication number 20080011046
- Publication date Jan 17, 2008
- Richard K. Workman
- G01 - MEASURING TESTING

Richard K. Workman

Person

Patents Grantslast 30 patents

Method and system for implementing augmented reality (AR)-based ass...

Method and system for implementing augmented reality (AR)-based ass...

Apparatus and method for facilitating manual sorting of slides

Atomic force microscope system using selective active damping

Probe tip assembly for scanning probe microscopes

Automatic generation of PID parameters for a scanning probe microscope

System for scanning probe microscope input device

Resonance method for determining the spring constant of scanning pr...

Force method for determining the spring constant of scanning probe...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR IMPLEMENTING AUGMENTED REALITY (AR)-BASED ASS...

Method and System for Implementing Augmented Reality (AR)-Based Ass...

APPARATUS AND METHODS FOR TRANSFERRING A TISSUE SECTION

AUGMENTED REALITY SLIDE SORTER

ATOMIC FORCE MICROSCOPE SYSTEM USING SELECTIVE ACTIVE DAMPING

Scanning Probe Microscope that Outputs Metadata with Image

Time-Tagged Data for Atomic Force Microscopy

PROBE TIP ASSEMBLY FOR SCANNING PROBE MICROSCOPES

System and methods for data sample decimation and display of scanni...

Automatic Generation Of PID Parameters For An Atomic Force Microscope

SYSTEM FOR SCANNING PROBE MICROSCOPE INPUT DEVICE

Force method for Determining the Spring Constant of Scanning Probe...

Resonance Method for Determining the Spring Constant of Scanning Pr...

Displacement Method for Determining the Spring Constant of Scanning...