Richard L. Guldi

Person

Dallas, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
By-die-exposure for patterning of holes in edge die
- Patent number 8,273,523
- Issue date Sep 25, 2012
- Texas Instruments Incorporated
- Shangting Detweiler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method to attain low defectivity fully silicided gates
- Patent number 8,273,645
- Issue date Sep 25, 2012
- Texas Instruments Incorporated
- Mark Robert Visokay
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Close proximity scanning surface contamination analyzer
- Patent number 7,897,410
- Issue date Mar 1, 2011
- Texas Instruments Incorporated
- Sean M. Collins
- G01 - MEASURING TESTING
Information Patent Grant
Structures for testing and locating defects in integrated circuits
- Patent number 7,772,867
- Issue date Aug 10, 2010
- Texas Instruments Incorporated
- Richard L. Guldi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductive device fabricated using subliming materials to form...
- Patent number 7,601,629
- Issue date Oct 13, 2009
- Texas Instruments Incorporated
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustable lithography blocking device and method
- Patent number 7,598,507
- Issue date Oct 6, 2009
- Texas Instruments Incorporated
- Basab Chatterjee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for cassette integrity testing using a wafer s...
- Patent number 7,596,456
- Issue date Sep 29, 2009
- Texas Instruments Incorporated
- Kelly C. Mollenkopf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic page sequencing and other feedback action based on analys...
- Patent number 7,579,541
- Issue date Aug 25, 2009
- Texas Instruments Incorporated
- Richard Guldi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
System and method for exposure of partial edge die
- Patent number 7,374,866
- Issue date May 20, 2008
- Texas Instruments Incorporated
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods for detecting structure dependent process defects
- Patent number 7,228,193
- Issue date Jun 5, 2007
- Texas Instruments Incorporated
- Richard L. Guldi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray confocal defect detection systems and methods
- Patent number 7,212,607
- Issue date May 1, 2007
- Texas Instruments Incorporated
- Satyavolu Srinivas Papa Rao
- G01 - MEASURING TESTING
Information Patent Grant
Alignment mark for e-beam inspection of a semiconductor wafer
- Patent number 7,171,035
- Issue date Jan 30, 2007
- Texas Instruments Incorporated
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pretreatment for an electroplating process and an electroplating pr...
- Patent number 7,112,540
- Issue date Sep 26, 2006
- Texas Instruments Incorporated
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for intelligent sampling of particulates in exhaust lines
- Patent number 7,024,950
- Issue date Apr 11, 2006
- Texas Instruments Incorporated
- Richard L. Guldi
- G01 - MEASURING TESTING
Information Patent Grant
In-situ randomization and recording of wafer processing order at pr...
- Patent number 6,975,920
- Issue date Dec 13, 2005
- Texas Instruments Incorporated
- Randolph W. Kahn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Sensitive test structure for assessing pattern anomalies
- Patent number 6,967,110
- Issue date Nov 22, 2005
- Texas Instruments Incorporated
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ randomization and recording of wafer processing order at pr...
- Patent number 6,862,495
- Issue date Mar 1, 2005
- Texas Instruments Incorporated
- Randolph W. Kahn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Error reduction in semiconductor processes
- Patent number 6,848,066
- Issue date Jan 25, 2005
- Texas Instruments Incorporated
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray defect detection in integrated circuit metallization
- Patent number 6,834,117
- Issue date Dec 21, 2004
- Texas Instruments Incorporated
- Satyavolu Papa Rao
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer edge marking
- Patent number 6,710,364
- Issue date Mar 23, 2004
- Texas Instruments Incorporated
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for electroplating fine geometries
- Patent number 6,689,686
- Issue date Feb 10, 2004
- Texas Instruments Incorporated
- Richard L. Guldi
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
In-situ randomization and recording of wafer processing order at pr...
- Patent number 6,684,125
- Issue date Jan 27, 2004
- Texas Instruments Incorporated
- Randolph W. Kahn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Error reduction in semiconductor processes
- Patent number 6,645,684
- Issue date Nov 11, 2003
- Texas Instruments Incorporated
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for producing wafer notches with rounded corners and a tool...
- Patent number 6,572,461
- Issue date Jun 3, 2003
- Texas Instruments Incorporated
- Richard L. Guldi
- B24 - GRINDING POLISHING
Information Patent Grant
Programmable physical action during integrated circuit wafer cleanup
- Patent number 6,488,037
- Issue date Dec 3, 2002
- Texas Instruments Incorporated
- Richard L. Guldi
- B08 - CLEANING
Information Patent Grant
Method for producing wafers with rounded corners in the notches use...
- Patent number 6,448,154
- Issue date Sep 10, 2002
- Texas Instruments Incorporated
- Richard L. Guldi
- B24 - GRINDING POLISHING
Information Patent Grant
Apparatus and method for cleaning a vertical furnace pedestal and cap
- Patent number 6,442,867
- Issue date Sep 3, 2002
- Texas Instruments Incorporated
- William Pressnall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer edge marking
- Patent number 6,420,792
- Issue date Jul 16, 2002
- Texas Instruments Incorporated
- Richard L. Guldi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Method and apparatus for in-situ reticle cleaning at photolithograp...
- Patent number 6,395,102
- Issue date May 28, 2002
- Texas Instruments Incorporated
- Sima Salamati-Saradh
- B08 - CLEANING
Information Patent Grant
Apparatus for in-situ reticle cleaning at photolithography tool
- Patent number 6,305,097
- Issue date Oct 23, 2001
- Texas Instruments Incorporated
- Sima Salamati-Saradh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD TO ATTAIN LOW DEFECTIVITY FULLY SILICIDED GATES
- Publication number 20110097884
- Publication date Apr 28, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Mark Robert VISOKAY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURES FOR TESTING AND LOCATING DEFECTS IN INTEGRATED CIRCUITS
- Publication number 20090212793
- Publication date Aug 27, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Richard L. Guldi
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR MONITORING IMPLANTER PERFORMANCE
- Publication number 20090166564
- Publication date Jul 2, 2009
- BENJAMIN G. MOSER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Close Proximity Scanning Surface Contamination Analyzer
- Publication number 20090153856
- Publication date Jun 18, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Sean M. Collins
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURES FOR E-BEAM TESTING OF SYSTEMATIC AND RANDOM DEFECTS...
- Publication number 20090102501
- Publication date Apr 23, 2009
- Richard L. Guldi
- G01 - MEASURING TESTING
Information Patent Application
Method for Manufacturing Microdevices or Integrated Circuits on Con...
- Publication number 20090087938
- Publication date Apr 2, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Deepak A. Ramappa
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Ebeam inspection for detecting gate dielectric punch through and/or...
- Publication number 20080176345
- Publication date Jul 24, 2008
- Texas Instruments Inc.
- Shaofeng Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC PAGE SEQUENCING AND OTHER FEEDBACK ACTION BASED ON ANALYS...
- Publication number 20080156171
- Publication date Jul 3, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Richard Guldi
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
BY-DIE-EXPOSURE FOR PATTERNING OF HOLES IN EDGE DIE
- Publication number 20080160779
- Publication date Jul 3, 2008
- Shangting Detweiler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for analyzing a light beam of a wafer inspection...
- Publication number 20080056557
- Publication date Mar 6, 2008
- TEXAS INSTRUMENTS INCORPORATED
- J.E. Patrick Gagnon
- G01 - MEASURING TESTING
Information Patent Application
CHANNEL SELECTION BASED ON PROGRAM CONTENT ATTRIBUTES
- Publication number 20070288961
- Publication date Dec 13, 2007
- RICHARD L. GULDI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Semiconductive device fabricated using subliming materials to form...
- Publication number 20070141829
- Publication date Jun 21, 2007
- Texas Instruments, Incorporated
- Deepak A. Ramappa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for cassette integrity testing using a wafer s...
- Publication number 20070118300
- Publication date May 24, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Kelly C. Mollenkopf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for detecting structure dependent process defects
- Publication number 20070038325
- Publication date Feb 15, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Richard L. Guldi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for exposure of partial edge die
- Publication number 20060078828
- Publication date Apr 13, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Sensitive test structure for assessing pattern anomalies
- Publication number 20060033503
- Publication date Feb 16, 2006
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pretreatment for an electroplating process and an electroplating pr...
- Publication number 20050164496
- Publication date Jul 28, 2005
- Texas Instruments, Incorporated
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for in situ seed layer remediation
- Publication number 20050040046
- Publication date Feb 24, 2005
- Aaron Frank
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Adjustable lithography blocking device and method
- Publication number 20040251429
- Publication date Dec 16, 2004
- Texas Instruments, Incorporated
- Basab Chatterjee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Sensitive test structure for assessing pattern anomalies
- Publication number 20040229388
- Publication date Nov 18, 2004
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
In-situ randomization and recording of wafer processing order at pr...
- Publication number 20040111176
- Publication date Jun 10, 2004
- Randolph W. Kahn
- G05 - CONTROLLING REGULATING
Information Patent Application
In-situ randomization and recording of wafer processing order at pr...
- Publication number 20040111180
- Publication date Jun 10, 2004
- Randolph W. Kahn
- G05 - CONTROLLING REGULATING
Information Patent Application
Semiconductor wafer edge marking
- Publication number 20040104361
- Publication date Jun 3, 2004
- Richard L. Guldi
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
Alignment mark for e-beam inspection of a semiconductor wafer
- Publication number 20040086172
- Publication date May 6, 2004
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Error reduction in semiconductor processes
- Publication number 20040029029
- Publication date Feb 12, 2004
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electroplater and method
- Publication number 20030116440
- Publication date Jun 26, 2003
- TEXAS INSTRUMENTS INCORPORATED
- Richard L. Guldi
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Method for producing wafer notches with rounded corners and a tool...
- Publication number 20030089931
- Publication date May 15, 2003
- Richard L. Guldi
- B24 - GRINDING POLISHING
Information Patent Application
Error reduction in semiconductor processes
- Publication number 20030068833
- Publication date Apr 10, 2003
- Chris D. Atkinson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and method for electroplating fine geometries
- Publication number 20030057099
- Publication date Mar 27, 2003
- Richard L. Guldi
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Programmable physical action during integrated circuit wafer cleanup
- Publication number 20030034046
- Publication date Feb 20, 2003
- Richard L. Guldi
- H01 - BASIC ELECTRIC ELEMENTS

Richard L. Guldi

Person

Patents Grantslast 30 patents

By-die-exposure for patterning of holes in edge die

Method to attain low defectivity fully silicided gates

Close proximity scanning surface contamination analyzer

Structures for testing and locating defects in integrated circuits

Semiconductive device fabricated using subliming materials to form...

Adjustable lithography blocking device and method

Method and apparatus for cassette integrity testing using a wafer s...

Automatic page sequencing and other feedback action based on analys...

System and method for exposure of partial edge die

Methods for detecting structure dependent process defects

X-ray confocal defect detection systems and methods

Alignment mark for e-beam inspection of a semiconductor wafer

Pretreatment for an electroplating process and an electroplating pr...

Method for intelligent sampling of particulates in exhaust lines

In-situ randomization and recording of wafer processing order at pr...

Sensitive test structure for assessing pattern anomalies

In-situ randomization and recording of wafer processing order at pr...

Error reduction in semiconductor processes

X-ray defect detection in integrated circuit metallization

Semiconductor wafer edge marking

System and method for electroplating fine geometries

In-situ randomization and recording of wafer processing order at pr...

Error reduction in semiconductor processes

Method for producing wafer notches with rounded corners and a tool...

Programmable physical action during integrated circuit wafer cleanup

Method for producing wafers with rounded corners in the notches use...

Apparatus and method for cleaning a vertical furnace pedestal and cap

Semiconductor wafer edge marking

Method and apparatus for in-situ reticle cleaning at photolithograp...

Apparatus for in-situ reticle cleaning at photolithography tool

Patents Applicationslast 30 patents

METHOD TO ATTAIN LOW DEFECTIVITY FULLY SILICIDED GATES

STRUCTURES FOR TESTING AND LOCATING DEFECTS IN INTEGRATED CIRCUITS

METHODS FOR MONITORING IMPLANTER PERFORMANCE

Close Proximity Scanning Surface Contamination Analyzer

TEST STRUCTURES FOR E-BEAM TESTING OF SYSTEMATIC AND RANDOM DEFECTS...

Method for Manufacturing Microdevices or Integrated Circuits on Con...

Ebeam inspection for detecting gate dielectric punch through and/or...

AUTOMATIC PAGE SEQUENCING AND OTHER FEEDBACK ACTION BASED ON ANALYS...

BY-DIE-EXPOSURE FOR PATTERNING OF HOLES IN EDGE DIE

System and method for analyzing a light beam of a wafer inspection...

CHANNEL SELECTION BASED ON PROGRAM CONTENT ATTRIBUTES

Semiconductive device fabricated using subliming materials to form...

Method and apparatus for cassette integrity testing using a wafer s...

Methods for detecting structure dependent process defects

System and method for exposure of partial edge die

Sensitive test structure for assessing pattern anomalies

Pretreatment for an electroplating process and an electroplating pr...

System for in situ seed layer remediation

Adjustable lithography blocking device and method

Sensitive test structure for assessing pattern anomalies

In-situ randomization and recording of wafer processing order at pr...

In-situ randomization and recording of wafer processing order at pr...

Semiconductor wafer edge marking

Alignment mark for e-beam inspection of a semiconductor wafer

Error reduction in semiconductor processes

Electroplater and method

Method for producing wafer notches with rounded corners and a tool...

Error reduction in semiconductor processes

System and method for electroplating fine geometries

Programmable physical action during integrated circuit wafer cleanup