Richard L. Kendrick

Person

San Mateo, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Photonic integrated circuit distance measuring interferometer
- Patent number 12,050,341
- Issue date Jul 30, 2024
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
Photonic integrated circuit with independent unit cells having mult...
- Patent number 11,962,350
- Issue date Apr 16, 2024
- Raytheon Company
- Stephen P. Palese
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Photonic integrated circuit with inverted H-tree unit cell design
- Patent number 11,894,873
- Issue date Feb 6, 2024
- Raytheon Company
- Stephen P. Palese
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Photonic integrated circuit-based imaging systems
- Patent number 11,815,714
- Issue date Nov 14, 2023
- Raytheon Company
- Richard L. Kendrick
- G02 - OPTICS
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,703,317
- Issue date Jul 18, 2023
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
System and method for calibrating PIC-based optical phased array tr...
- Patent number 11,703,739
- Issue date Jul 18, 2023
- Raytheon Company
- Richard L. Kendrick
- G02 - OPTICS
Information Patent Grant
Photonic integrated circuit-based optical phased array phasing tech...
- Patent number 11,532,881
- Issue date Dec 20, 2022
- Raytheon Company
- Richard L. Kendrick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Swept frequency photonic integrated circuit for absolute metrology
- Patent number 11,320,255
- Issue date May 3, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
Heterodyne photonic integrated circuit for absolute metrology
- Patent number 11,221,204
- Issue date Jan 11, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Photonic integrated circuit for heterodyne imaging
- Patent number 11,102,426
- Issue date Aug 24, 2021
- Lockheed Martin Corporation
- Richard Lee Kendrick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-lenslet PIC imagers and packaging configurations
- Patent number 11,035,985
- Issue date Jun 15, 2021
- Lockheed Martin Corporation
- Guy Chriqui
- G01 - MEASURING TESTING
Information Patent Grant
Linear-fan configuration of photonic integrated circuit imagers
- Patent number 10,914,900
- Issue date Feb 9, 2021
- Lockheed Martin Corporation
- Richard L. Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Photonic integrated circuit optical spectrometer
- Patent number 10,753,796
- Issue date Aug 25, 2020
- Lockheed Martin Corporation
- Alan Lee Duncan
- G01 - MEASURING TESTING
Information Patent Grant
Super-PIC SPIDER
- Patent number 10,302,409
- Issue date May 28, 2019
- Lockheed Martin Corporation
- Alan Lee Duncan
- G02 - OPTICS
Information Patent Grant
Segmented planar imaging detector for electro-optic reconnaissance...
- Patent number 10,012,827
- Issue date Jul 3, 2018
- Lockheed Martin Corporation
- Alan L. Duncan
- G02 - OPTICS
Information Patent Grant
Interferometer array imaging system using photonic integrated circu...
- Patent number 9,754,985
- Issue date Sep 5, 2017
- Lockheed Martin Corporation
- Alan L. Duncan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide field image distortion correction
- Patent number 8,994,784
- Issue date Mar 31, 2015
- Lockheed Martin Corporation
- Richard L. Kendrick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Segmented planar imaging detector for electro-optic reconnaissance
- Patent number 8,913,859
- Issue date Dec 16, 2014
- Lockheed Martin Corporation
- Alan L. Duncan
- G02 - OPTICS
Information Patent Grant
Systems and methods for multi-function coherent imaging
- Patent number 8,068,235
- Issue date Nov 29, 2011
- Lockheed Martin Corporation
- Joseph C. Marron
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Near field suppression with a multi-aperture imaging system
- Patent number 7,973,937
- Issue date Jul 5, 2011
- Lockheed Martin Corporation
- Richard L. Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced multiple instrument distributed aperture sensor
- Patent number 7,631,839
- Issue date Dec 15, 2009
- Lockheed Martin Corporation
- Alan L. Duncan
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Enhanced recovery of low spatial frequency spectral information in...
- Patent number 7,580,586
- Issue date Aug 25, 2009
- Lockheed Martin Corporation
- Eric H. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Restoration of Fizeau FTS spectral data using low and/or zero spati...
- Patent number 7,436,518
- Issue date Oct 14, 2008
- Lockheed Martin Corporation
- Eric H. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Generation of spatially distributed spectral data using a multi-ape...
- Patent number 7,391,519
- Issue date Jun 24, 2008
- Lockheed Martin Corporation
- Richard L. Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Fourier transform spectrometry with a single-aperture interferometer
- Patent number 7,352,470
- Issue date Apr 1, 2008
- Lockheed Martin Corporation
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Phase diversity method and apparatus using fourier transform spectr...
- Patent number 7,092,103
- Issue date Aug 15, 2006
- Lockheed Martin Corporation
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Grant
Fourier transform spectrometry with a multi-aperture interferometer
- Patent number 7,034,945
- Issue date Apr 25, 2006
- Lockheed Martin Corporation
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic coherent nuller
- Patent number 6,882,427
- Issue date Apr 19, 2005
- Lockheed Martin Corporation
- Richard L. Kendrick
- G01 - MEASURING TESTING
Information Patent Grant
Fast phase diversity wavefront correction using a neural network
- Patent number 6,787,747
- Issue date Sep 7, 2004
- Lockheed Martin Corporation
- Donald Francis Specht
- G01 - MEASURING TESTING
Information Patent Grant
Multi-aperture imaging system
- Patent number 5,905,591
- Issue date May 18, 1999
- Lockheed Martin Corporation
- Alan L. Duncan
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
PHOTONIC INTEGRATED CIRCUIT DISTANCE MEASURING INTERFEROMETER
- Publication number 20240272353
- Publication date Aug 15, 2024
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT WITH INVERTED H-TREE UNIT CELL DESIGN
- Publication number 20240007185
- Publication date Jan 4, 2024
- Raytheon Company
- Stephen P. Palese
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT-BASED IMAGING SYSTEMS
- Publication number 20230288634
- Publication date Sep 14, 2023
- Raytheon Company
- Richard L. Kendrick
- G02 - OPTICS
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT WITH INDEPENDENT UNIT CELLS HAVING MULT...
- Publication number 20230291480
- Publication date Sep 14, 2023
- Raytheon Company
- Stephen P. Palese
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT-BASED OPTICAL PHASED ARRAY PHASING TECH...
- Publication number 20220255219
- Publication date Aug 11, 2022
- Raytheon Company
- Richard L. Kendrick
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING PIC-BASED OPTICAL PHASED ARRAY TR...
- Publication number 20220229343
- Publication date Jul 21, 2022
- Raytheon Company
- Richard L. Kendrick
- G01 - MEASURING TESTING
Information Patent Application
HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220187055
- Publication date Jun 16, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
- Publication number 20220049945
- Publication date Feb 17, 2022
- Raytheon Company
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Application
PHOTONIC INTEGRATED CIRCUIT DISTANCE MEASURING INTERFEROMETER
- Publication number 20220019019
- Publication date Jan 20, 2022
- Raytheon Company
- Richard Lee Kendrick
- G02 - OPTICS
Information Patent Application
WIDE FIELD IMAGE DISTORTION CORRECTION
- Publication number 20120162359
- Publication date Jun 28, 2012
- Lockheed Martin Corporation
- Richard L. Kendrick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Fourier transform spectrometry with a multi-aperture interferometer
- Publication number 20040095580
- Publication date May 20, 2004
- Lockheed Martin Corporation
- Richard Lee Kendrick
- G01 - MEASURING TESTING
Information Patent Application
Fast phase diversity wavefront correction using a neural network
- Publication number 20040056174
- Publication date Mar 25, 2004
- Donald Francis Specht
- G02 - OPTICS

Richard L. Kendrick

Person

Patents Grantslast 30 patents

Photonic integrated circuit distance measuring interferometer

Photonic integrated circuit with independent unit cells having mult...

Photonic integrated circuit with inverted H-tree unit cell design

Photonic integrated circuit-based imaging systems

Heterodyne photonic integrated circuit for absolute metrology

System and method for calibrating PIC-based optical phased array tr...

Photonic integrated circuit-based optical phased array phasing tech...

Swept frequency photonic integrated circuit for absolute metrology

Heterodyne photonic integrated circuit for absolute metrology

Photonic integrated circuit for heterodyne imaging

Multi-lenslet PIC imagers and packaging configurations

Linear-fan configuration of photonic integrated circuit imagers

Photonic integrated circuit optical spectrometer

Super-PIC SPIDER

Segmented planar imaging detector for electro-optic reconnaissance...

Interferometer array imaging system using photonic integrated circu...

Wide field image distortion correction

Segmented planar imaging detector for electro-optic reconnaissance

Systems and methods for multi-function coherent imaging

Near field suppression with a multi-aperture imaging system

Enhanced multiple instrument distributed aperture sensor

Enhanced recovery of low spatial frequency spectral information in...

Restoration of Fizeau FTS spectral data using low and/or zero spati...

Generation of spatially distributed spectral data using a multi-ape...

Fourier transform spectrometry with a single-aperture interferometer

Phase diversity method and apparatus using fourier transform spectr...

Fourier transform spectrometry with a multi-aperture interferometer

Dynamic coherent nuller

Fast phase diversity wavefront correction using a neural network

Multi-aperture imaging system

Patents Applicationslast 30 patents

PHOTONIC INTEGRATED CIRCUIT DISTANCE MEASURING INTERFEROMETER

PHOTONIC INTEGRATED CIRCUIT WITH INVERTED H-TREE UNIT CELL DESIGN

PHOTONIC INTEGRATED CIRCUIT-BASED IMAGING SYSTEMS

PHOTONIC INTEGRATED CIRCUIT WITH INDEPENDENT UNIT CELLS HAVING MULT...

PHOTONIC INTEGRATED CIRCUIT-BASED OPTICAL PHASED ARRAY PHASING TECH...

SYSTEM AND METHOD FOR CALIBRATING PIC-BASED OPTICAL PHASED ARRAY TR...

HETERODYNE PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY

PHOTONIC INTEGRATED CIRCUIT DISTANCE MEASURING INTERFEROMETER

WIDE FIELD IMAGE DISTORTION CORRECTION

Fourier transform spectrometry with a multi-aperture interferometer

Fast phase diversity wavefront correction using a neural network