Richard L. Sumner

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Pomona, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for measuring time intervals with very high re...
- Patent number 6,137,749
- Issue date Oct 24, 2000
- LeCroy Corporation
- Richard L. Sumner
- G01 - MEASURING TESTING
Information Patent Grant
Vernier delay line interpolator and coarse counter realignment
- Patent number 5,838,754
- Issue date Nov 17, 1998
- LeCroy Corporation
- Mark S. Gorbics
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Vernier delay line interpolator and coarse counter realignment
- Patent number 5,703,838
- Issue date Dec 30, 1997
- LeCroy Corporation
- Mark S. Gorbics
- H03 - BASIC ELECTRONIC CIRCUITRY