Richard L. Trantow

Person

Denoe Bay, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for measuring a surface contour of an object
- Patent number 6,906,808
- Issue date Jun 14, 2005
- General Electric Company
- Richard L. Trantow
- G01 - MEASURING TESTING
Information Patent Grant
Molded eddy current array probe
- Patent number 6,812,697
- Issue date Nov 2, 2004
- General Electric Company
- William Stewart McKnight
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current inspection probe
- Patent number 6,563,307
- Issue date May 13, 2003
- General Electric Company
- Richard Lloyd Trantow
- G01 - MEASURING TESTING
Information Patent Grant
Reference standard for inspection of dual-layered coatings
- Patent number 6,552,536
- Issue date Apr 22, 2003
- General Electric Company
- Richard L. Trantow
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Surface following brush seal
- Patent number 6,540,231
- Issue date Apr 1, 2003
- General Electric Company
- Richard L. Trantow
- F05 - INDEXING SCHEMES RELATING TO ENGINES OR PUMPS IN VARIOUS SUBCLASSES OF...
Information Patent Grant
Eddy current inspection probe and method of use
- Patent number 6,469,503
- Issue date Oct 22, 2002
- General Electric Company
- Richard Lloyd Trantow
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current calibration standard
- Patent number 6,356,069
- Issue date Mar 12, 2002
- General Electric Company
- Richard L. Trantow
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current inspection probe
- Patent number 6,339,326
- Issue date Jan 15, 2002
- General Electric Company
- Richard L. Trantow
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring and controlling laser shock peening using tem...
- Patent number 6,075,593
- Issue date Jun 13, 2000
- General Electric Company
- Richard L. Trantow
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Determination of Rayleigh wave critical angle
- Patent number 5,987,991
- Issue date Nov 23, 1999
- General Electric Company
- Richard L. Trantow
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic multi-transducer rotatable scanning apparatus and method...
- Patent number 5,974,889
- Issue date Nov 2, 1999
- General Electric Company
- Richard L. Trantow
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Molded eddy current array probe
- Publication number 20040056656
- Publication date Mar 25, 2004
- General Electric Company
- William Stewart McKnight
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatus for measuring a surface contour of an object
- Publication number 20030223082
- Publication date Dec 4, 2003
- Richard L. Trantow
- G01 - MEASURING TESTING
Information Patent Application
Eddy current inspection probe
- Publication number 20030025496
- Publication date Feb 6, 2003
- Richard Lloyd Trantow
- G01 - MEASURING TESTING
Information Patent Application
Reference standard for inspection of dual-layered coatings
- Publication number 20030008065
- Publication date Jan 9, 2003
- General Electric Company
- Richard L. Trantow
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
EDDY CURRENT INSPECTION PROBE AND METHOD OF USE
- Publication number 20020135363
- Publication date Sep 26, 2002
- Richard Lloyd Trantow
- G01 - MEASURING TESTING

Richard L. Trantow

Person

Patents Grantslast 30 patents

Methods and apparatus for measuring a surface contour of an object

Molded eddy current array probe

Eddy current inspection probe

Reference standard for inspection of dual-layered coatings

Surface following brush seal

Eddy current inspection probe and method of use

Eddy current calibration standard

Eddy current inspection probe

Method for monitoring and controlling laser shock peening using tem...

Determination of Rayleigh wave critical angle

Ultrasonic multi-transducer rotatable scanning apparatus and method...

Patents Applicationslast 30 patents

Molded eddy current array probe

Methods and apparatus for measuring a surface contour of an object

Eddy current inspection probe

Reference standard for inspection of dual-layered coatings

EDDY CURRENT INSPECTION PROBE AND METHOD OF USE