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Richard Norio BLYTHE
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Tokyo, JP
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last 30 patents
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Patent Grant
Method for detecting defects in ultra-high resolution panels
Patent number
11,335,222
Issue date
May 17, 2022
Raul Albert Martin
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last 30 patents
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Patent Application
A METHOD FOR DETECTING DEFECTS IN ULTRA-HIGH RESOLUTION PANELS
Publication number
20200111396
Publication date
Apr 9, 2020
Photon Dynamics, Inc.
Raul Albert MARTIN
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