Richard Orr

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San Mateo, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Electrical test structure and method for characterization of deep t...
- Patent number 7,960,998
- Issue date Jun 14, 2011
- National Semiconductor Corporation
- Lisa V. Rozario
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL TEST STRUCTURE AND METHOD FOR CHARACTERIZATION OF DEEP T...
- Publication number 20090206865
- Publication date Aug 20, 2009
- Lisa V. Rozario
- G01 - MEASURING TESTING