Richard P. Ryan

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Spokane, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
IF frequency response characterization employing overlapping freque...
- Patent number 7,310,504
- Issue date Dec 18, 2007
- Agilent Technologies, Inc.
- Raymond A. Birgenheier
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
RF test set with concurrent measurement architecture
- Patent number 6,587,671
- Issue date Jul 1, 2003
- Agilent Technologies, Inc.
- Kerwin D. Kanago
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for measuring modulation accuracy
- Patent number 5,187,719
- Issue date Feb 16, 1993
- Hewlett-Packard Company
- Raymond A. Birgenheier
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring phase accuracy and amplitude pro...
- Patent number 5,001,724
- Issue date Mar 19, 1991
- Hewlett-Packard Company
- Raymond A. Birgenheier
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IF frequency response characterization employing overlapping freque...
- Publication number 20050215217
- Publication date Sep 29, 2005
- Raymond A. Birgenheier
- H04 - ELECTRIC COMMUNICATION TECHNIQUE