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Richard P. Torti
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Burlington, MA, US
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Patents Grants
last 30 patents
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Patent Grant
Gas cluster ion beam size diagnostics and workpiece processing
Patent number
6,831,272
Issue date
Dec 14, 2004
Epion Corporation
Michael E. Mack
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Detector and method for cluster ion beam diagnostics
Patent number
6,737,643
Issue date
May 18, 2004
Epion Corporation
Richard P. Torti
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas cluster ion beam low mass ion filter
Patent number
6,635,883
Issue date
Oct 21, 2003
Epion Corporation
Richard P. Torti
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Gas cluster ion beam smoother apparatus
Patent number
6,486,478
Issue date
Nov 26, 2002
Epion Corporation
Bruce K. Libby
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Gas cluster ion beam size diagnostics and workpiece processing
Publication number
20020070361
Publication date
Jun 13, 2002
Epion Corporation
Michael E. Mack
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Detector and method for cluster ion beam diagnostics
Publication number
20010054686
Publication date
Dec 27, 2001
Richard P. Torti
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Gas cluster ion beam low mass ion filter
Publication number
20010033128
Publication date
Oct 25, 2001
Richard P. Torti
H01 - BASIC ELECTRIC ELEMENTS